edfas.org 17 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 27 NO. 1 ABOUT THE AUTHORS Bogdan Mihail Cretu received a bachelor’s degree in physics from University Al.I.Cuza, Iasi, Romania, in 1998. He received an M.Sc. (1999) and a Ph.D. (2003) in physics of semiconductors from the National Polytechnic Institute, Grenoble (INPG), France. He joined the National Graduate School of Engineering & Research Centre (ENSICAEN) as associate professor in 2003 and joined the GREYC laboratory for its research activities. His expertise is in the analysis and semi-analytical modeling of low frequency noise in advanced semiconductor devices. Abderrahim Tahiat received a master’s degree in electronics of embedded systems and telecommunications from the University of Toulouse III, France, in 2022. In the same year, he began his Ph.D. studies at GREYC, Caen, France. His research focuses on the characterization and analysis of low frequency noise at cryogenic temperatures in state-of-the-art CMOS technologies. Rosine Coq Germanicus is a full professor at CRISMAT UMR6508 Laboratory (Laboratoire de Cristallographie et Sciences des Matériaux) at the University of Caen in Normandy, France. After a university degree in physics at Guadeloupe, she received her Ph.D. at the University Montpellier 2, France, in space radiation effects on optoelectronic devices. Her current research activity focuses on scanning probe microscopy for microelectronic devices and radiation effects. Her research includes nano-electrical, failure analysis, and reliability of integrated semiconductor devices. Françoise Bezerra received her degree in electronic engineering from the French Civil Aviation National School (ENAC) in 1991. She joined the CNES (Centre National d’Etudes Spatiales), the French Space Agency, in 1992 as a quality insurance engineer. Now, she coordinates the radiation test campaigns and supports R&D projects. Recognized as an expert in radiation hardness assurance, she supports space projects and especially new space programs. She is member of the Radiation Working Group of the European Component Technology Board and the RADECS association (Radiation and its Effects on Components and Systems). Catherine Bunel is a distinguished graduate in electronic sciences and electrotechnics from Paris, began her career at RTC Compelec in 1985, specializing in LED development. She then progressed through various roles in integrated circuit development and manufacturing at Philips and NXP. In 2009, as one of the founding members of IPDiA society, she directed R&D, advanced front-end and back-end technologies and design for integrated silicon capacitors and passive devices. Currently at Murata, since 2016, she spearheads research and development initiatives for silicon capacitors. Anabela Veloso received a Ph.D. from INESC/IST-Lisbon University, Portugal, in 2002. Since 2001, she has been working at imec, in Leuven, Belgium, where she is a principal member of technical staff. Currently, her main research interests are in the areas of advanced CMOS device physics, integration, characterization, and technology, with recent focus on the exploration of scaled nanowires/ nanosheets-based FETs (with lateral or vertical transport), logic with backside power delivery and functional backside, and overall novel device schemes that also take into consideration possible new options for transistor engineering and connectivity by using both wafer sides. Eddy Simoen obtained his Ph.D. in engineering from Ghent University in 1985. He is retired from imec, Leuven, Belgium, where he was active from 1986 until 2022 in the field of low frequency noise and defect characterization. He is currently a guest professor at Ghent University focusing on defect characterization and engineering in semiconductor materials and devices.
RkJQdWJsaXNoZXIy MTYyMzk3NQ==