Decrease time to yield, manage manufacturing excursions and recover yield caused by systematic defects with Tessent yield learning software. By understanding how to manage and optimize the test and data collection environment, yield learning solutions can identify systematic defects that cause low yield, saving time. Tessent yield learning software leverages test and design data to uncover hidden yield limiters and help identify root cause of defect mechanisms. Scan diagnosis analysis maximizes failure analysis success rate. siemens.com/tessent-yield-learning Tessent Yield Learning from Siemens EDA Join us at booth #401
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