edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 26 NO. 4 54 TRAINING CALENDAR LIFELONG LEARNING EDFAS believes in lifelong learning and supporting our members and customers in that endeavor. Our goal is to provide a list of educational resources in failure analysis and related topics in each issue of EDFA magazine. In addition, explore all EDFAS has to offer from regional events, chapter courses, and tutorials and courses during ISTFA. Find out more by visiting edfas.org. Rosalinda M. Ring, NenoVision jmj4papa@yahoo.com EVENT DATE LOCATION AVS 70th International Symposium & Exposition 11/3-8 Tampa, FL Contact: AVS 12th International Workshop on Nitride Semiconductors (IWN) 11/3-8 Honolulu, HI Contact: IWN Symposium on Reliability for Electronics and Photoonics Packaging (REPP) 11/7-8 West Lafayette, IN Contact: REPP Principles of Failure Analysis 11/11-14 Novelty, OH Contact: ASM International Physical Assurance and Inspection of Electronics 11/12-14 Hunstville, AL Contact: PAINE SEMICON Europa 11/12-15 Munich, Germany Contact: SEMICON Europa IEEE CPMT Symposium Japan 11/13-15 Kyoto, Japan Contact: ICSJ 15th International Symposium on Atomic Level Characterization for New Materials and Devices (ALC) 11/17-22 Matsue, Japan Contact: ALC Defect-based Testing 11/18-19 Munich, Germany Wafer Fab Processing 11/25-28 Munich, Germany Contact: Semitracks Inc. 21st China International Forum on Solid State Lighting & 10th International Forum on Wide Bridge Semiconductors (SSLCHINA/ IFWS) 11/18-21 Suzhou, China Contact: IFWS November 2024 EVENT DATE LOCATION International Confer- ence on the Challenges, Opportunities, Innovations, and Applications in Electronic Textiles 11/19-21 Berlin, Germany Contact: E-TEXTILES IMAPS France: Power Electronics and Packaging European Workshop 11/28 Tours, France Contact: IMAPS France November 2024 (cont'd) EVENT DATE LOCATION Materials Research Society Fall Meeting & Exhibit 12/1-6 Boston, MA Contact: MRS Working on Innovative Devices and Systems 12/1-6 Big Island, HI Contact: WINDS 2024 Failure and Yield Analysis 12/2-5 Munich, Germany Semiconductor Reliability and Product Qualification 12/9-12 Munich, Germany Contact: Semitracks Inc. 6th Electronics Packaging Technology Conference (EPTC) 12/3-6 Singapore Contact: EPTC Scanning Electron Microscopy 12/6 Novelty, OH Principles of Failure Analysis 12/9-11 Virtual Event Contact: ASM International 70th Annual International Electron Devices Meeting (IEDM) 12/7-11 San Francisco, CA Contact: IEDM December 2024
RkJQdWJsaXNoZXIy MTYyMzk3NQ==