edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 26 NO. 4 52 of diverse materials, eliminating the limitations of immersion optics, while offering a wide field of view and various scanning modes. The AMBER X 2 includes multimodal and multiscale analysis capability supporting unique 3D methods like 3D ToF-SIMS for detailed elemental composition analysis which is crucial for next-generation battery research. For more information, visit tescan.com. A GLOVE BOX LOAD LOCK FOR ELECTRON MICROSCOPY University of Oregon’s Center for Advanced Materials Characterization Oregon (CAMCOR) introduces Noble Dome, an innovative solution for loading air-sensitive materials into a FIB or TEM, eliminating the need for an intermediary device to transfer samples between instruments. Traditional sample-loading procedures expose samples to atmosphere during transfer between glove box and multiple instruments, the Noble Dome preserves the integrity of the environment. Noble Dome is the glove box and has no sample size limit, no stage travel limit, no robotic or electronic parts to break or repair. An airfree TEM rod easily fits inside, streamlining FIB to TEM sample transfers. A transparent dome allows users to PRODUCT NEWS Ted Kolasa, Northrop Grumman ted.kolasa@gmail.com PRESS RELEASE SUBMISSIONS: MAGAZINES@ASMINTERNATIONAL.ORG AMBER X 2 PLASMA FIB-SEM SYSTEM Tescan, in collaboration with Orsay Physics, announces the launch of AMBER X 2, a plasma FIB-SEM system designed to set new standards for materials science research. This state-of-the-art system offers unmatched resolution, throughput, and versatility for comprehensive sample preparation and characterization. The AMBER X 2 leverages Orsay Physics’ extensive expertise in plasma FIB-SEM technology, offering significant benefits for materials science applications, namely increased precision enabling fully automated TEM/STEM specimen preparation, and enhanced milling efficiency. These are complemented by improved FIB optical parameters, a field-free SEM column, and multimodal and multiscale materials characterization capabilities, providing an all-encompassing solution. Key features of the AMBER X 2 include the MISTRAL Plasma FIB Column which optimizes beam parameters for superior beam profiles, simplifying workflows and improving precision, beam placement accuracy at low ion beam energies, and milling performance; the TEM AutoPrep Pro which supports a fully automated workflow for precise and efficient TEM sample preparation; and the Field-Free UHR-SEM Column which allows high-resolution imaging The Tescan AMBER X 2 offers unmatched features supporting comprehensive sample preparation and characterization. Noble Dome is an innovative solution for loading air-sensitive materials into a FIB or TEM.
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