edfas.org 39 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 26 NO. 4 ISTFA GENERAL CHAIRS Harold Weil..................................................1976-1977 Douglas McCormac.....................................1978-1981 Leon Hamiter..............................................1982-1985 L. Hamiter, D. McCormac, Larry Kashar..............1986 Leon Hamiter.......................................................1988 Jim Beall...............................................................1989 Richard Flutie.......................................................1990 Tom May...............................................................1991 Denis Renaud.......................................................1992 Keenan Evans.......................................................1993 Gary Shade...........................................................1994 Larry Wagner........................................................1995 Edward I. Cole......................................................1996 Shekhar Khandekar.............................................1997 Tom Lee................................................................1998 Sandra Delgado...................................................1999 Dan Barton...........................................................2000 Richard J. Ross.....................................................2001 Christian Boit.......................................................2002 Thomas M. Moore................................................2003 Matthew L. Thayer...............................................2004 Lee Knauss...........................................................2005 Cheryl Hartfield....................................................2006 Chris Henderson..................................................2007 David P. Vallett.....................................................2008 Nicholas Antoniou...............................................2009 William E. Vanderlinde.........................................2010 Jeremy Walraven.................................................2011 Philippe Perdu.....................................................2012 Zhiyong Wang......................................................2013 Dan Bodoh...........................................................2014 James J. Demarest...............................................2015 Martin Keim..........................................................2016 Sam Subramanian...............................................2017 Efrat Moyal...........................................................2018 Felix Beaudoin.....................................................2019 David Grosjean.....................................................2020 Susan Li................................................................2021 Zhigang Song.......................................................2022 Frank Altmann......................................................2023 Yan Li....................................................................2024 GUEST EDITORIAL CONTINUED FROM PAGE 2 Dr. Jack Kilby, inventor of the integrated circuit, signed autographs after an engrossing and captivating talk at ISTFA 1999. WHAT DOES ISTFA MEAN TO YOU? “Getting involved and volunteering at ISTFA has given me the most rewarding experience professionally out of everything I have done in my career.” – James Demarest, FASM, IBM “ISTFA is not just about technical knowledge, but also about meeting people and learning together.” – Chris Richardson, Allied High Tech Products “I continually see the people I met at my first ISTFA every year. They say it’s not what you know, it’s who you know. And ISTFA has had a big impact on my career.” – Keith Serrels, NXP Semiconductors “I encourage all young people to come to ISTFA because they will learn and grow so much.” – Yan Li, Samsung “The speakers who have had a lasting impact on me are the ones who have sponsored me to be more involved with ISTFA.” – Renee Parente, AMD The following papers were presented in 1975: • Detection and Protection Techniques for Electrostatic Discharge in Microcircuits • Failure Analysis Techniques for PROMs • Some New Methods for Sectioning Microcircuit Metallization • Failure Analysis of Microwave Semiconductor Devices • Some Advanced Techniques for Device Failure Analysis • Failure Analysis and Automated Testers • Ion Microprobe Analysis of Electronic Devices • Advanced Microcircuit Testing Techniques using the Scanning Electron Microscope
RkJQdWJsaXNoZXIy MTYyMzk3NQ==