edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 26 NO. 4 38 EDFAS MEMBERS RECEIVE ASM AWARDS The Electronic Device Failure Analysis Society (EDFAS) is proud to announce that three of its members have been named as recipients of 2024 ASM Awards. ASM FELLOWS Ryan R. Ross, FASM, foundry FI/FA technical lead, Intel Corp., Phoenix, was named to the 2024 Class of Fellows of ASM International. He was cited “for sustained contributions in failure analysis, from semiconductor technology development to advancing the state of practice in spacecraft development for deep-space exploration.” Dr. Zhigang Song, FASM, senior engineer, IBM, Albany, N.Y., was named to the 2024 Class of Fellows of ASM International. He was cited “for outstanding leadership and creativity in the field of failure analysis and demonstrated innovation and industrial impact in failure analysis techniques for microelectronic devices.” Ross and Song join Larry Wagner (2010), Ed Cole (2013), Bill Vanderlinde (2014), Lee Knauss (2016), Philippe Perdu (2016), Cheryl Hartfield (2017), Dehua Yang (2018), Felix Beaudoin (2019), Richard McSwain (2019), Janez Grum (2020), Virginia Osterman (2020), Michael Pecht (2020), James Demarest (2021), Philip Kazuba (2021), Frank Stellari (2022), Christian Boit (2023), and Jeremy A. Walraven (2023) as EDFAS members selected for this honor. SILVER MEDAL Dr. Keith A. Serrels, failure analysis development team lead, NXP Semiconductors, Austin, has received the 2024 Silver Medal award. He was cited “for originating, implementing, and leading the inaugural electronic device FA Technology Roadmap program, and for sustained research and development of advanced optical fault isolation techniques.” The medal was established in 2010 to recognize members who are in mid-career positions for distinguished contributions in the field of materials science and engineering, and the society. NOTEWORTHY NEWS IEDM 2024 The 70th International Electron Devices Meeting (IEDM) will be held December 7-11 at the Hilton San Francisco Union Square. IEDM is a leading forum for reporting breakthroughs in the technology, design, manufacturing, physics, and modeling of semiconductors and other electronic devices. Topics of interest include circuit and device interactions; characterization, reliability, and yield; compound semiconductor and high-speed devices; memory technology; modeling and simulation; nano device technology; optoelectronics, displays, and imagers; power devices, process and manufacturing technology, and sensors, MEMS, and BioMEMS. IEDM is sponsored by the IEEE Electron Devices Society. For more information, visit ieee-iedm.org and watch for any updates to the meeting plan.
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