edfas.org 49 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 26 NO. 3 EVENT DATE LOCATION Metallography for Failure Analysis 10/21-24 Novelty, OH Contact: ASM International SMTA International Conference & Exposition 10/21-24 Rosemont, IL Contact: SMTA International Symposium for Test and Failure Analysis (ISTFA) 10/2811/1 San Diego, CA Contact: ASM International October 2024 Check organizers’ websites below for the most up-to-date information. IMAPS 919.293.5000 imaps.org/page/IMAPS2024 IMAPS France 919.293.5000 france.imapseurope.org/imaps ITC 714.816.2108 ieeeitc@computer.org www.itctestweek.org SEMI semihq@semi.org SEMICON Europa +49.30.3030.8077.0 semiconeuropa@semi.org semiconeuropa.org Semitracks Inc. 505.858.0454 info@semitracks.com semitracks.com SMTA 952.920.7682 smta@smta.org smta.org/events Contact Information AI Hardware and Edge AI Summit +44.0.20.3696.2920 events@kisacoresearch.com www.aihwedgesummit.com/events/aihwedgesummit ASM International 440.338.5151 memberservicecenter@asminternational.org asminternational.org CEI Europe +46.13.100.730 cei@cei.se www.cei.se DVCon dvcontaiwan.org ESREF info@esref2024.org www.esref2024.org HOTCHIPS chair@hotchips.org hotchips.org ICEPT support@fsemi.tech www.icept.org November 2024 (cont'd) EVENT DATE LOCATION Defect-based Testing 11/18-19 Munich, Germany Wafer Fab Processing 11/25-28 Munich, Germany Contact: Semitracks Inc. Introduction to Semiconductor Packaging Technology 11/4-6 Amersfoort, The Netherlands IC Reliability, Fault Isolation, and Failure Analysis 11/4-8 Amersfoort, The Netherlands Silicon Device Technology: Materials and Processing Overview On-chip and 3D Interconnects: Technology, Performance, and Reliability 11/25-27 Munich, Germany Contact: CEI Europe IMAPS France Power Electronics and Packaging European Workshop 11/28 Tours, France Contact: IMAPS France November 2024 EVENT DATE LOCATION International Test Conference (ITC) 11/3-8 San Diego, CA Contact: ITC SEMICON Europa 2024, ELECTRONICA 2024 11/12-15 Munich, Germany Contact: SEMICON Europa Visit the Electronic Device Failure Analysis Society website edfas.org
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