edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 26 NO. 3 46 chamber is reduced. Even during prolonged preparation of large specimen amounts, the device fully suppresses ice contamination. SEM specifications include a landing voltage from 0.1 to 30.0 kV, beam current from 1 pA to 300 nA and an image resolution as good as 1.6 nm at 15kV. The FIB has an accelerating voltage range from 1.0 to 30.0 kV, beam current from 1 pA to 90 nA, and image resolution as low as 4.0 nm at 30 kV. For more information, visit www.jeol.com. MINIMET 1000 COMPACT GRINDER POLISHER The MiniMet 1000 grinder polisher from Buehler Inc. is a compact semi-automatic, single-specimen machine ideal for users with limited space or for use in a hot enclosure. This highly robust machine comes with an automatic arm so users can focus on other tasks while processing. The MiniMet 1000 is for low-volume laboratories preparing single specimens. This semiautomatic grinder-polisher prepares a wide variety of materials using the three self-contained preparation bowls. Its space saving design employs a proprietary geometric action that combines the advantages of hand as well as mechanical polishing. This motion provides a random polishing action, eliminating any induced polishing artifacts. PRODUCT NEWS Ted Kolasa, Northrop Grumman ted.kolasa@gmail.com PRESS RELEASE SUBMISSIONS: MAGAZINES@ASMINTERNATIONAL.ORG CRYO-FIB-SEM SYSTEM FOR SAMPLE PREP Jeol’s CRYO-FIB-SEM CryoLameller system incorpo- rates a liquid nitrogen cooling stage and a cryocooled specimen transfer mechanism for frozen specimens, making it possible to prepare flexible TEM specimens such as biopolymers. The specimen transfer mechanism has a built-in sputter coating function. Therefore, this CRYO-FIB-SEM system alone can perform a series of processes to create TEM specimens from frozen specimens including conductivity coating, protective film forming, and FIB processing. In the standard configuration, a Pt sputter coating system is built into specimen exchange chamber. In addition, by using Jeol’s CRYO ARM cartridge, direct specimen transfer after TEM specimen preparation becomes easier. After attaching a specimen mesh to the cartridge, it is no longer necessary to handle the specimen mesh using tweezers, so high-throughput specimen transfer can be performed. The CryoLameller’s highly stable thermally conductive cooling stage reduces stage drift and vibration caused by the cooling process and realizes steady TEM specimen preparation. And with Jeol’s newly developed anticontamination device, ice contamination in the specimen The CRYO-FIB-SEM CryoLameller system is ideal for cold temperature TEM sample preparation. The MiniMet 1000 grinder polisher is designed for lowvolume laboratories preparing single specimens.
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