edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 26 NO. 3 44 LITERATURE REVIEW The current column comprises peer-reviewed articles published since 2019 on optical microscopy, optical fault isolation, photonics, solar cells, photovoltaics, and light emitting diodes (LEDs). Optical methods and techniques are fundamental to nondestructive analysis of modern integrated circuits. Note that inclusion in the list does not vouch for the article’s quality and category sorting is by no means strict. If you wish to share an interesting, recently published peer-reviewed article with the community, please forward the citation to the email address listed above and I will try to include it in future installments. Entries are listed in alphabetical order by first author, then title, journal, year, volume, and first page. Note that in some cases bracketed text is inserted into the title to provide clarity about the article subject. Peer-Reviewed Literature of Interest to Failure Analysis: Optics, optical techniques and fault isolation, photonics, solar, photovoltaics, and LEDs Michael R. Bruce, Consultant mike.bruce@earthlink.net • I. Arata, H. Terada, M. Vervaeke, et al.: “Design and Manufacturing of Aspherical GaAs-SILs for a Versatile Optical Semiconductor Failure Analysis System,” Micron. Reliab., 2023, 145, p. 115001. • A.C. Bento, N. Cella, S.M. Lima, et al.: “Photoacoustic and Photothermal and the Photovoltaic Efficiency of Solar Cells: A Tutorial,” J. Appl. Phys., 2022, 131, p. 141101. • I. Charaev, D.A. Bandurin, A.T. Bollinger, et al.: “Single-photon Detection using High-temperature Superconductors,” Nat. Nanotechnol., 2023, 18, p. 343. • D.J. Colvin, E.J. Schneller, and K.O. Davis: “Cell Dark Current–voltage from Non-calibrated Module Electroluminescence Image Analysis [for Photovoltaics],” Solar Energy, 2022, 244, p. 448. • Y. Han, H. Park and J. Bowers, et al.: “[Photonics Review:] Recent Advances in Light Sources on Silicon,” Adv. Opt. Photon., 2022, 14, p. 404. • S. Hariyani, J. Brgoch, F. Garcia-Santamaria, et al.: “From Lab to Lamp: Understanding Downconverter Degradation in LED Packages,” J. Appl. Phys., 2022, 132, p. 190901. • Z. He, Y. Zhang, X. Tong, et al.: “Quantum Microscopy of Cells at the Heisenberg Limit,” Nat Commun, 2023, 14, p. 2441. • M. Horio, T. Sumi, J. Bullock, et al.: “Detecting Driving Potentials at the Buried SiO2 Nanolayers in Solar Cells by Chemical-selective Nonlinear X-ray Spectroscopy,” Appl. Phys. Lett., 2023, 123, p. 031602. • K.J.P. Jacobs: “[Re-routing Pads Using] Inkjet- printed Electrical Interconnects for High Resolution Integrated Circuit Diagnostics [with OBIRCH],” Commun Eng, 2023, 2, p. 21. • H. Jiang and J. Lin: “How We Made the MicroLED,” Nat Electron, 2023, 6, p. 257. • N. Kamal, M.I. Alam, V. Shekher, et al.: “Identification and Characterization of Solar Cell Defects using Thermal Imaging,” International Journal of Recent Technology and Engineering (IJRTE), 2019, 8, p. 6064. • T. Lai, B.G. Potter, and K. Simmons-Potter: “Electroluminescence Image Analysis of a Photovoltaic Module Under Accelerated Lifecycle Testing,” Appl. Opt., 2020, 59, p. G225. • H.J. Lee, M.M.A. Gamel, P.J. Ker, et al.: “Absorption Coefficient of Bulk III-V Semiconductor Materials: A Review on Methods, Properties and Future Prospects,” J. Electron. Mater., 2022, 51, p. 6082. • G.B. Lemos, M. Lahiri, S. Ramelow, et al.: “Quantum Imaging and Metrology with Undetected Photons: Tutorial,” J. Opt. Soc. Am. B, 2022, 39, p. 2200. • H.J. Levinson: “Progress Review: High-NA EUV Lithography: Current Status and Outlook for the Future,” Jpn. J. Appl. Phys., 2022, 61, p. SD0803. • H.J. Levinson: “Progress Review: Lithography in a Quantum World,” Jpn. J. Appl. Phys., 2023, 62, p. SG0802. • H. Li, Y. Lu, T. Zhu, et al.: “Impact of Gamma-ray Irradiation on Photo Emission from InGaN/GaN LED,” Micron. Reliab., 2023, 142, p. 114915. • W. Lin, J. Huang, S. Li, et al.: “Study of Pristine and Degraded Blue Quantum Dot Light-emitting
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