edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 26 NO. 3 24 Advertise in Electronic Device Failure Analysis magazine! For information about advertising in Electronic Device Failure Analysis: KJ Johanns, Business Development Manager 440.671.3851, kj.johanns@asminternational.org Current rate card may be viewed online at asminternational.org/advertise. ABOUT THE AUTHORS M. Shafkat M. Khan received a M.S. in electrical engineering from University of Florida in 2023, and a B.S. degree in electrical and electronic engineering from the Bangladesh University of Engineering and Technology (BUET), Dhaka, Bangladesh, in 2019. He is currently pursuing a Ph.D. in the Electrical and Computer Engineering Department, University of Florida, Gainesville, Fla. His research is focused on multidie packaging security, hardware security and trust, and physical inspection and attacks. Chengjie Xi received an M.S. degree in materials science from the University of Florida, Gainesville, Fla., in 2020, where he is currently pursuing a Ph.D. degree in the Electrical and Computer Engineering Department. His research is focused on developing counterfeit detection and prevention methods for integrated circuit designs and packaging. Nitin Varshney is currently working as a lab engineer at the Florida Institute for Cyber Security (FICS) Research for the last four years. He received his master’s degree in materials science from the University of California, San Diego. He had multiple internship experiences in hardware assurance while earning his bachelor’s degree at Australian National University, National University of Singapore, A*STAR, and North Carolina State University. His extensive experience with physical assurance and failure analysis tools like FIB-SEM, X-RAY, TEM, PHEMOS, LSI, probing, and sample preparation has resulted in three patents and several peer reviewed publications. Hamed Dalir, an associate professor at the University of Florida, specializes in quantum AI, semiconductor lasers, and photonics computing. Formerly co-founder and CEO of Optelligence LLC, he has been pivotal in developing innovative technologies in AI and blockchain. His work, recognized by the Yoshida Foundation Award and JSPS Fellowship, has resulted in over 250 journal/conference publications. Dalir holds senior positions in IEEE/SPIE/Optica and is an associate editor for EPJ Quantum Technology. Navid Asadizanjani is an associate professor in the ECE Department at the University of Florida. He investigates novel techniques for IC counterfeit detection and prevention, system and chip level decomposition and security assessment, antireverse engineering, 3D imaging, invasive and semi-invasive physical assurance, and supply chain security. Asadi has received an NSF CAREER Award and several best paper awards from the IEEE International Symposium on Hardware Oriented Security and Trust (HOST) and the ASME International Symposium on Flexible Automation (ISFA). He was also winner of D.E. Crow Innovation Award from University of Connecticut. He is cofounder and the program chair of the IEEE Physical Assurance and Inspection of Electronics (PAINE) Conference.
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