edfas.org 49 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 26 NO. 2 TRAINING CALENDAR LIFELONG LEARNING EDFAS believes in lifelong learning and supporting our members and customers in that endeavor. Our goal is to provide a list of educational resources in failure analysis and related topics in each issue of EDFA magazine. In addition, explore all EDFAS has to offer from regional events, chapter courses, and tutorials and courses during ISTFA. Find out more by visiting edfas.org. Rosalinda M. Ring, Thermo Fisher Scientific jmj4papa@yahoo.com EVENT DATE LOCATION On Shoring Advanced Packaging and Assembly 4/29-5/1 Arlington, VA Contact: On Shoring Advanced CMOS/ FinFET Fabrication 5/6-7 Phoenix, AZ Failure and Yield Analysis 5/13-16 Phoenix, AZ Fundamentals of HighVolume Production Test 5/20-21 Phoenix, AZ Semiconductor Reliability and Product Qualification 5/20-23 Phoenix, AZ Contact: Semitracks Inc. SMTA Europe: Advanced Manufacturing Conference and Line Tour 5/9 County Clare, Ireland Electronics in Harsh Environments Conference and Exhibition 5/14-16 Copenhagen, Denmark Contact: SMTA Headquarters IEEE Workshop on Signal and Power Integrity 5/12-15 Lisbon, Portugal Contact: SPI SEMI Advanced Semiconductor Manufacturing Conference 5/13-16 Albany, NY Contact: ASMC Fundamentals of Metrology 5/13-17 Gaithersburg, MD Contact: NIST International Spring Seminar on Electronics Technology 5/15-19 Prague, Czech Republic Contact: ISSE Scanning Electron Microscopy 5/17 Novelty, OH Contact: ASM International May 2024 EVENT DATE LOCATION International Conference on Electron, Ion, and Photo Beam Technology and Nanofabrication 5/28-31 La Jolla, CA Contact: EIPBN IEEE Electronic Components and Technology Conference 5/28-31 Denver, CO Contact: ECTC IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems 5/28-31 Aurora, CO Contact: ITherm May 2024 (cont'd) EVENT DATE LOCATION Main SEM and X-ray Microanalysis Course 6/2-7 Bethlehem, PA Introduction to SEM and EDS for the New Operator 6/2-7 Bethlehem, PA FIB Instrumentation and Applications 6/2-7 Bethlehem, PA Contact: Lehigh Microscopy School National Initiative for Cybersecurity Education 6/3-5 Dallas, TX Contact: NIST ANADEF Workshop 6/3-7 Landes, France Contact: ANADEF CAM Workshop: Innovation in Failure Analysis and Material Diagnostics of Electronics Components 6/4-5 Halle, Germany Contact: CAM Workshop June 2024
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