edfas.org 1 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 26 NO. 2 A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS MAY 2024 | VOLUME 26 | ISSUE 2 edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS DEPARTMENTS MicroStructural Hierarchy Descriptor Enabling Interpretative AI for Microelectronic Failure Analysis Zhiheng Huang, Ziyan Liao, Kaiwen Zheng, Xin Zeng, Yuezhong Meng, Hui Yan, and Yang Liu The MicroStructural Hierarchy Descriptor is proposed as a systematic and quantitative approach to spectra and image data in microelectronic failure analysis. Author Guidelines Author guidelines and a sample article are available at edfas.org. Potential authors should consult the guidelines for useful information prior to manuscript preparation. 4 10 2 GUEST EDITORIAL Felix Beaudoin 40 2024 PHOTO CONTEST 41 2024 VIDEO CONTEST 42 EDUCATION NEWS Bhanu Sood 44 DIRECTORY OF FA PROVIDERS Rosalinda Ring 46 LITERATURE REVIEW Michael R. Bruce 47 PRODUCT NEWS Ted Kolasa 49 TRAINING CALENDAR Rosalinda Ring 51 GUEST COLUMN Sarah Poehlmann, Renee Parente, Joseph Caroselli, and Tom Schamp 52 ADVERTISERS INDEX Electro-thermal Simulation and Reliability of a Ball Grid Array Norelislam El Hami, Aicha Koulou, Maria Zemzami, and Abdelkhalak El Hami The influence of electric current flow and electrically induced Joule heat on thermal stress for weld joint cracks at both interfaces is still not fully comprehended. This article investigates the effect of subjecting the BGA package to a cyclic current input. 22 For the digital edition, log in to edfas.org, click on the “News & Magazines” tab, and select “EDFA Magazine.” Scanning Thermal Microscopy for Localizing and Monitoring Defects in Electronics Séverine Gomès This article presents the principle of SThM instruments and their potential uses for the local thermal analysis of passive and active electronic components and devices. 10 4 22 32 Differential Laser Voltage Probe: A Brief Overview and Thoughts on What Could Come Next Kristofor Dickson Differential laser voltage probe simultaneously acquires waveform data from a single target while the device under test fluctuates between passing and failing test outcomes. 32 ABOUT THE COVER Micro potted plant. Photo by Susanne Hübner, Fraunhofer Institute for Microstructure of Materials and Systems IMWS. First Place Winner in Black and White Images, 2023 EDFAS Photo Contest.
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