edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 26 NO. 1 48 2023 EDFAS AWARD WINNERS EDFAS AWARD WINNERS: RECOGNIZING INDUSTRY PIONEERS AND LEADERS James Demarest, FASM, Chair, EDFAS Awards and Nominations Committee Immediate Past President, EDFAS jjdemar@us.ibm.com The ASM Electronic Device Failure Analysis Society established two awards to recognize the accomplishments of its members. I am pleased to highlight the 2023 winners. The EDFAS Lifetime Achievement Award recognizes those who have given their time, knowledge, and abilities toward the advancement of the electronic device failure analysis industry. The 2023 awardee is David Albert, failure analysis engineer, retired, IBM Corp., Hopewell Jct., N.J. His citation reads: “in recognition of dedication and leadership in the sustained development of the nanoprobing fault isolation technique over 42 years, and being a patient teacher and loyal custodian in EDFAS.” David Albert retired in 2021 after 42 years with IBM. During most of his career he performed failure analysis on electronic devices. While supporting IBM’s 300 mm wafer fab, Dave was the Technical Lead within the electrical characterization (yield) group covering FEOL, MOL, and devices. Dave holds degrees in electronics and physics. Over his career he has been involved with optical fault isolation, microprobing, SEM imaging and materials analysis, plus nanoprobing. These evolved into turning functional test and optical fault isolation results into EFA gameplans, plus interpreting nanoprobed transistor data. Twice Dave has taught both semiconductor physics and semiconductor processing within IBM’s failure analysis and materials analysis area. Dave has participated in ISTFA and other conferences over the years. He has authored four ISTFA papers and been co-author on another five ISTFA papers. Dave is currently a tutorial presenter and has been a User Group presenter. He serves on ISTFA’s Nanoprobing Committee where he is currently the Chair. Dave has also participated in ASM’s IMAT conference where he teaches his ISTFA Tutorial. The EDFAS President’s Award recognizes those who provided an exceptional amount of effort in their service to the Society. The 2023 awardee is David Burgess, owner of Accelerated Analysis, Half Moon Bay, Calif. His citation reads: “for extensive contributions to EDFAS exemplifying an EDFA volunteer and continuous involvement as a Board member, organizer, tutor, and session chair helping to make EDFAS and ISTFA exceptional. David Burgess is a failure analyst and reliability engineer. He developed techniques and taught in those areas at Fairchild Semiconductor and Hewlett-Packard. He is the founder of Accelerated Analysis, a manufacturer and distributor of specialty failure analysis tools. David is the co-author of Wafer Failure Analysis for Yield Enhancement. A graduate of Rensselaer Polytechnic Institute and San Jose State University, he is a member of EDFAS and has served on the editorial board of EDFA magazine and various ISTFA committees. Please join me in thanking David Albert and David Burgess for their significant contributions to inventing improved industry techniques and providing key research and education to benefit the FA community. To continue the recognition of worthy contributors, I urge you to send suggestions for next year’s award to me at jjdemar@ us.ibm.com. To learn more, visit asminternational.org/ web/edfas/societyawards. David Albert received the 2023 EDFAS Lifetime Achievement Award. David Burgess is the 2023 EDFAS President’s Award winner.
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