edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 4 48 DIRECTORY OF INDEPENDENT FA PROVIDERS Rosalinda M. Ring, Thermo Fisher Scientific jmj4papa@yahoo.com Electronic companies of all types and sizes require failure analysis (FA) services. Our goal is to supply a resource of FA service providers for your reference files. The directory lists independent providers and their contact information, expertise, and types of technical services offered. ADVANCED CIRCUIT ENGINEERS 308 S. Abbott Ave. Milpitas, CA 95035 408.719.1617 sales@advancedcircuitengineers.com Services Offered: Advanced level FIB circuit editing, dual-beam (FIB-SEM) imaging and atomic resolution TEM analytical services. Tools and Techniques: FIB circuit edit, TEM–STEM, EDX, EELS, dual-beam FIB cross-section, and electron backscatter diffraction (EBSD). IMINA TECHNOLOGIES SA Route de Montheron 8B 1053 Cugy (VD) Switzerland +41.21.552.40.50 imina.ch/en/services Services Offered: Electrical failure analysis and nanoprobing services. Tools and Techniques: Imina Technologies NANO solution, EBAC, RCI, EBIC and EBIRCh, TESCAN CLARA SEM, IBSS Group Plasma Cleaner, Point Electronic EFA Module, and Keithley 4200A Parameter Analyzer. MATEXCEL SUITE 210, 17 Ramsey Rd. Shirley, NY 11967 631.869.4956 info@matexcel.com www.matexcel.com/services/materials-analysis-services Services Offered: Morphology analysis, compositional analysis, size and molecular weight analysis, thermal and mechanical analysis, product analysis, cryo-electron microscopy analysis, STM analysis, synchrotron radiation test, hydrogen penetration testing, compositional analysis, size and molecular weight analysis, and thermal and mechanical analysis. Tools and Techniques: SEM/EDS, TEM, atomic force mi- croscopy (AFM), optical microscope, FIB-SEM, S/TEM tomog- raphy, cryo-EM, ellipsometry, grazing-incidence smallangle x-ray scattering (GI-SAXS), confocal microscopy, XRF, atomic absorption spectroscopy (AAS), nuclear mag- netic resonance (NMR), attenuated total reflectance-FTIR (ATR-FTIR), micro-FTIR/Raman spectroscopy, nano-FTIR/ Raman, FTIR, near-infrared (NIR), and Raman spectroscopy, real-time magnified x-ray imaging, EDX, XPS, auger electron spectroscopy (AES), micro x-ray absorption near edge spectroscopy (Μxanes), and vibrational spectroscopy. PARTICLE TECHNOLOGY LABS 555 Rogers St. Downers Grove, IL 60515 630.403.0099 sales@particletechlabs.com particletechlabs.com/analytical-testing Services Offered: Particle size distribution, adsorption and porosimetry, particle identification/speciation, powder flowability, thermal analyses, zeta potential analysis, and method development. Tools and Techniques: SEM/EDS, Raman spectroscopy, laser diffraction, single particle optical sensing (SPOS)/ light obscuration, electric sensing zone, dynamic light scattering, nanoparticle tracking analysis, particle size and shape analysis/image analysis, sieve analysis, air permeability diameter, thermogravimetric analysis, differential scanning calorimetry, density analysis, dynamic viscosity, refractive index (RI), digital microscopy, USP 788 Particulate Matter in Injectables, small part and medical device cleanliness testing, technical cleanliness testing, chemisorption, dynamic vapor sorption, water activity, BET specific surface area, capillary flow porometry, micropore measurement, mesopore measurement, and mercury intrusion porosimetry. PHOENIX NATIONAL LABORATORIES INC. 941 South Park Lane Tempe, AZ 85281 602.431.8887 pnltest@pnltest.com pnltest.com/contact-info Services Offered: Quality testing, inspection, and engineering services. Tools and Techniques: Nondestructive testing services (NDT), ultrasonic testing (UT): welds and thickness, x-ray: film and filmless, magnetic particle testing, penetrant testing, leak testing, eddy current testing, liquid penetrant, bubble leak test, ground penetrating radar (GPR), positive material identification, hardness testing, SEM, EDS, optical microscopes, carbon content analysis, IR thermography, and FTIR.
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