edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 4 44 Microsystems Corp., and low yield analysis engineer and lab manager at Intel Corp. Ring is an energetic force and has used her positive attitude and tireless energy in serving EDFAS in various roles, including editor of EDFA magazine (2008–2011), EDFA associate editor (2000 to present), session chair (2000 to present), and ISTFA organizer (poster, tutorial, case histories sessions). These experiences enabled her to personally meet many prominent representatives of worldwide FA community and get closely familiar with the leading-edge technology FA research and achievements. Vision Statement I believe passionately in the power of sharing information and building individuals through education. We strive to offer conferences and magazine content that appeal to the devoted failure analysts striving to enhance their skills and learn about the latest equipment, as well as professionals and academics who want to keep up with our dynamic field. Everything EDFAS does is driven by this goal: How can we best serve our constituency and help them excel in their jobs and careers? GUEST EDITORIAL CONTINUED FROM PAGE 2 with new testing, new ways to use testing, and new designs for testability continuing to be part of the failure analyst’s toolbox. We also need to remember that capabilities are not enough. We need the workforce to face the new FA challenges. STEM education initiatives are having increasing focus to supply new scientists and engineers for a breath of needs, including FA engineers to use and research capabilities. This is an ongoing problem and not solved, but it is getting the needed recognition and some traction toward being addressed. So, we have a new FA chapter of challenging problems needing clever innovation and new capabilities to meet ever-changing needs. What’s new? Nothing. We have been here before. Indeed, this is where the FA community lives and flourishes. The microelectronics industry can be accused of many things, but stagnation is not one of them. The drive to meet new customer needs will mean new devices and new FA challenges. So how do we get ready for the next chapter? Fortunately, all will be exactly the same as it has been: Always changing. We should already be ready. ACKNOWLEDGMENT Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC, a wholly owned subsidiary of Honeywell International Inc. for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525. This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government.
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