edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 4 42 BOARD CANDIDATE PROFILES PROFILES OF CANDIDATES FOR THE EDFAS BOARD OF DIRECTORS James Demarest, FASM, Chair, EDFAS Awards & Nominations Committee jjdemar@us.ibm.com Phil Kaszuba, FASM, is a retired Senior Member of the Technical Staff for GlobalFoundries and is now employed as a consultant in nanotechnology/semiconductors. He holds a B.S.E.E. from the University of Vermont and has worked in the semiconductor industry for over 43 years at IBM/GlobalFoundries’ Essex Junction, Vt. fab. He held multiple positions there before settling into the Analytical Services Lab organization where he started a scanning probe microscopy lab in 1993. Among his early accomplishments, he and his team were instrumental in developing scanning Kelvin probe microscopy (SKPM) as an applied method for profiling dopant distribution on individual semiconductor field effect transistors. Kaszuba led the SPM Lab for 27 years until his retirement in 2020. Kaszuba has been directly involved with the initial development of many of the SPM based analytical techniques and instruments used in the semiconductor industry today. The sample preparation method he developed and published at ISTFA in 1995 is the foundation for many methodologies in use today. He has authored numerous articles and papers, including the SPM chapter in the Failure Analysis Desk Reference 7th Edition (2019). Kaszuba’s most recent breakthrough work, entitled “Scanning Capacitance Microscopy and Spectroscopy for Root Cause Analysis on Location Specific Individual FinFET Devices” won the Best Paper Award at ISTFA 2019. Kaszuba was elected an ASM Fellow in 2021. Kaszuba has served as an ISTFA session chair for the past 22 years; and served as a scanning probe microscopy subject matter expert on the Die Level Roadmap Council, contributing to the EDFAS Technology Roadmap. He is a member of the EDFAS Awards and Nominations Committee and serves on the editorial review board for the Nanoscientific journal. Vision Statement The semiconductor industry continues to evolve at an aggressive, rapid pace. Not only has the demand for cutting edge technologies increased, but the need for chips also built in older, established technologies has exploded. Unprecedented demands have fallen upon the analytical labs that provide critical support to technology development, manufacturing operations, quality control, and failure analysis. There is an increasingly important need to provide accurate analytical data/results faster, more efficiently, and more cost effectively. To adequately support these critical needs of the industry it is imperative that dedicated, creative thinkers and state of the art equipment are continually brought into the analytical lab environment. EDFAS is the organization that can help accomplish these objectives and meet both current and future needs in semiconductor device analysis. To ensure a solid future, it is my vision that the EDFAS Board be a driving force to: Introduce and recruit young The EDFAS Board of Directors unanimously approved one new member and reappointed two members with terms beginning in 2023. Members-At-Large 2023-2026 • Phil Kaszuba, FASM • Jim Colvin (Reappointed) • Rosalinda Rose (Reappointed) Congratulations to these board members.
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