edfas.org 41 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 4 SPIRIT ELECTRONICS Spirit Electronics has acquired Insight Analytical labs, bringing over 30 years of experience to our portfolio of failure analysis services. Device analysis gives you a detailed look inside a component to verify its physical integrity. Minute production flaws or weaknesses can compromise performance and lifespan. Prevent failures by identifying defects early in your process. Verify component performance, validate manufacturing processes, and meet MIL-STD requirements for aerospace and defense. spiritelectronics.com BOOTH 526 SIEMENS BOOTH 305 TED PELLA INC. Ted Pella Inc. is a premier supplier of consumables AND sample preparation tools and accessories for optical light microscopy and electron microscopy applications. We carry a wide range of preparation supplies, SEM sample holders, TEM grids, support films and calibration standards. We manufacture many of our own instruments, accessories, and tools for sample preparation under the PELCO brand name including the Dimpler and a family of Scribing & Cleaving equipment for semiconductor applications. tedpella.com/Material-Sciences_html/ electronics-semiconductor-overview.aspx BOOTH 607 ULTRA TEC ULTRA TEC’s ASAP-1 IPS is a digital sample preparation system for the decapsulation, thinning and polishing of die, package, module and wafer-level devices. The new 2nd generation unit adds a suite of key features and upgrades. Machine vision cameras provide a unique, ALWAYS-LIVE view, along with key navigational and process control shown on the larger touchscreen. Auto head-lift and fluid control system improves the user experience. ultratecusa.com BOOTH 301 CARL ZEISS MICROSCOPY ZEISS delivers actionable information to meet the semiconductor industry’s challenges for next-generation devices with high-resolution and efficient microscopy workflows for failure analysis and characterization spanning wafer, die and packaging applications. ZEISS offers a full range of light, electron, ion, and x-ray microscopes. zeiss.com/semiconductor-microscopy BOOTH 500 ROBSON TECHNOLOGIES INC. BOOTH 606 Robson Technologies Inc. (RTI) is recognized as the global leader in automated curve tracing. Perform nondestructive DC parametric test and analysis on packaged devices with tens to thousands of pins using up to four unique power domains. RTI’s powerful new DataTrace software suite makes setup, data collection, comparison and reporting an easy and straightforward process. RTI also provides customizable test fixtures and DUT board interfaces for these systems. Contact RTI for a personalized demo. testfixtures.com/ automated-curve-tracers Siemens’ Tessent software accelerates defect identification and yield learning in digital semiconductor devices. It leverages volume scan diagnosis data to perform defect identification and guide failure analysis. Join us to get an overview of the Tessent diagnosis flow and see how the Tessent collaboration with the PDF Solutions Exensio platform can be leveraged to improve the accuracy of defect root cause paretos and die picking for failure analysis. siemens.com/tessent
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