edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 4 36 EDFAS AWARDS SEEKING NOMINATIONS FOR EDFAS AWARDS The ASM Electronic Device Failure Analysis Society established two awards to recognize the accomplishments of its members. The awards will be given at ISTFA 2024. Nominate a worthy colleague today! EDFAS LIFETIME ACHIEVEMENT AWARD EDFAS Lifetime Achievement Award was established by the EDFAS Board of Directors in 2015 to recognize leaders in the EDFAS community who have devoted their time, knowledge, and abilities to the advancement of the electronic device failure analysis industry. EDFAS PRESIDENT’S AWARD The EDFAS President’s Award shall recognize exceptional service to EDFAS and the electronic device failure analysis community. Examples of such service include, but are not limited to committee service, service on the Board of Directors, organization of conferences or symposia, development of education courses, student and general public outreach. While any member of EDFAS is expected to further the Society’s goals through service, this award shall recognize those who provided an exceptional amount of effort in their service to the Society. Nomination deadline for both awards is March 1, 2024. For rules and nomination forms, visit the EDFAS website at edfas.org, click on Membership & Networking and then Society Awards, or contact Mary Anne Jerson at 440.671.3877, maryanne.jerson@asminternational.org. EDFAS MEMBERS RECEIVE ASM AWARDS The Electronic Device Failure Analysis Society (EDFAS) is proud to announce that two of its members have been named as recipients of 2023 ASM Awards. ASM FELLOWS Prof. Christian Boit, FASM, chair, Semiconductor Devices, retired, and Technische Universitaet Berlin, was named to the 2023 Class of Fellows of ASM International. He was cited “for sustained contributions to microelectronics failure analysis and for educating and training future analysts.” Jeremy A. Walraven, FASM, principal member of technical staff, Sandia National Laboratories, Albuquerque, N.M., was named to the 2023 Class of Fellows of ASM International. He was cited “for continued research, development, and implementation of failure analysis technologies enabling the understanding of failure mechanisms and reliability of microelectromechanical systems.” Boit and Walraven join Larry Wagner (2010), Ed Cole (2013), Bill Vanderlinde (2014), Lee Knauss (2016), Cheryl Hartfield (2017), Dehua Yang (2018), Felix Beaudoin (2019), Richard McSwain (2019), Janez Grum (2020), Virginia Osterman (2020), Michael Pecht (2020), James Demarest (2021), Philip Kazuba (2021), and Frank Stellari (2022), as EDFAS members selected for this honor.
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