edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 4 26 Matthew Tedaldi is a senior application development manager at Infinitesima, Oxford. He is primarily focused on developing novel techniques to measure and characterize nanoscale 3D devices in the challenging world of semiconductor and logic devices. He earned a masters in physics and a masters in research at the University of Liverpool, U.K., specializing on the interactions between biological systems and surfaces. Previous positions have included senior scientist at the National Physical Laboratory, U.K. and in instrumentation development at early-stage start-ups. Lennaert Wouters received a master’s degree in physics from the Catholic University of Leuven, Leuven, Belgium, in 2015, and a postgraduate degree in applied artificial intelligence from the Howest University, Bruges, Belgium, in 2022. He has been an R&D engineer at IMEC, Leuven, Belgium, since 2015. He is working on materials and device characterization by electrical scanning probe microscopy techniques, with main expertise in scanning spreading resistance microscopy. Thomas Hantschel currently leads the scanning probe microscopy group at IMEC focusing on the characterization of semiconductor device structures and the development of novel SPM characterization knowhow. He is also actively working on the design, prototyping, and fabrication of advanced scanning probe sensors for nanoscopic electrical measurements. He holds over 20 patents and first-authored more than 25 publications. Hantschel received a master’s degree in electrical engineering from Dresden University of Technology and a Ph.D. from the KULeuven, Belgium, in the area of scanning probe development for nanoscopic electrical measurements. Patrick Hole has a Ph.D. from the Optoelectronics Research Centre, Southampton, and an MEng from the University of Oxford. Hole previously worked for Malvern Panalytical, as the strategic technology leader responsible for supporting R&D in filling capability gaps with external collaborations. Prior to Malvern Panalytical he was one of the first employees at NanoSight and for much of his time there was the head of R&D. Andrew Humphris has worked in nanoscale imaging, specifically scanning probe microscopy, since 1997. After completing his Ph.D. at the University of Bristol, he worked as a research fellow and proleptic lecturer at the University. In 2001, he co-founded the spin-out company Infinitesima Ltd., where he is currently the chief technology officer. Umberto Celano is an associate professor with Ira A. Fulton Schools of Engineering at Arizona State University. His research interests lie at the intersection of condensed matter physics, semiconductor technology, and materials analysis, with a focus on nanoelectronics. He has worked at international research centers such as IMEC in Belgium and Stanford University, while also providing consultancy services to major semiconductor foundries and equipment manufacturers. Whether networking at events or accessing information through EDFA, ISTFA proceedings, or journals, our members have the edge. Now it’s time to introduce EDFAS to others in the industry who would like to take advantage of these careerenhancing benefits. Help us help the industry by expanding our membership and offering others the same exceptional access to information and networking that sets EDFAS apart. To reacquaint yourself with and introduce others to the EDFAS member benefits, visit asminternational.org/web/edfas/membership. EDFAS MEMBERSHIP
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