edfas.org 1 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 4 DEPARTMENTS Laser-based Copper Deposition for Semiconductor Debug Applications Michael DiBattista, Scott Silverman, and Matthew M. Mulholland Laser-assisted copper deposition provides a key technology for analyzing complex packaging and integrated circuit challenges. Author Guidelines Author guidelines and a sample article are available at edfas.org. Potential authors should consult the guidelines for useful information prior to manuscript preparation. 4 12 A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS NOVEMBER 2023 | VOLUME 25 | ISSUE 4 edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS 2 GUEST EDITORIAL Edward I. Cole, Jr. 36 EDFAS AWARDS 36 ASM AWARDS 37 CALL FOR PAPERS 38 ISTFA 2023 EXHIBITORS LIST 40 ISTFA 2023 EXHIBITOR SHOWCASE 42 BOARD CANDIDATE PROFILES James Demarest 46 UNIVERSITY HIGHLIGHT Ted Kolasa 48 DIRECTORY OF FA PROVIDERS Rosalinda Ring 50 TRAINING CALENDAR Rosalinda Ring 52 LITERATURE REVIEW Michael R. Bruce 54 PRODUCT NEWS Ted Kolasa 57 GUEST COLUMN Lesley Endrinal and Szu Huat Goh 60 ADVERTISERS INDEX An Innovative Multi-probe Tomographic Atomic Force Microscope for Materials Research and Failure Analysis D. Sharma, M. Tedaldi, L. Wouters, T. Hantschel, Patrick Hole, A.D.L. Humphris, and U. Celano This article describes recent advancements in multi-probe sensing schemes and development of a tomographic atomic force microscopy tool for materials research and failure analysis. 20 For the digital edition, log in to edfas.org, click on the “News/Magazines” tab, and select “EDFA Magazine.” Superconducting X-ray Sensors for Tomography of Microelectronics Joseph W. Fowler, Zachary H. Levine, Paul Szypryt, and Daniel S. Swetz The high energy-resolving power of superconducting x-ray detectors reduces unwanted x-ray backgrounds, uses x-ray photons efficiently, and allows for discrimination among multiple chemical elements in a sample. 12 4 Voltage Contrast within Electron Microscopy: From a Curious Effect to Debugging Modern ICs James Vickers, Blake Freeman, and Neel Leslie A scanning electron microscope system measures voltage contrast on device-under-test surfaces. 28 ABOUT THE COVER See page 56 for a description of the contest images collage on the cover. 20 28
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