edfas.org 43 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 2 NOTEWORTHY NEWS ESREF 2023 The 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2022) will take place October 2-5 in Toulouse, France. This international symposium has a focus on reliability in all aspects of electronics including new applications in extremely harsh environments such as space, transport, energy conversion, and smart functions. It provides the leading European forum for developing all aspects of reliability management and innovative analysis techniques for present and emerging semiconductor applications. For more information, visit esref2023.sciencesconf.org. NOTEWORTHY NEWS NANOTS 2023 The 43rd annual NANO Testing Symposium (NANOTS 2023) will be held November 7-9 at Senri Life-Science Center, in Toyonaka, Osaka, Japan. NANOTS is one of the leading technical symposiums for discussing solutions that improve the testing process of nanoscale devices and materials. NANOTS is sponsored by the Institute of NANO Testing in cooperation with the Institute of Electronics, Information and Communication Engineers, the Japan Society of Applied Physics, the Reliability Engineering Association of Japan, and the Union of Japanese Scientists and Engineers. For more information, visit the NANOTS website at www-nanots.ist.osaka-u.ac.jp. Advertise in Electronic Device Failure Analysis magazine! For information about advertising in Electronic Device Failure Analysis: Kelly Johanns, Business Development Manager 440.671.3851, kelly.johanns@asminternational.org Current rate card may be viewed online at asminternational.org/mediakit.
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