edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 2 28 ABOUT THE AUTHORS Anna Safont-Andreu is an industrial Ph.D. student at Infineon Technologies in collaboration with the University Klagenfurt, Austria. Her thesis focuses on applications of natural language processing to improve information extraction and retrieval from FA systems. She is also interested in other applications of AI in the industrial environment such as computer vision. Konstantin Schekotihin is a professor of intelligent systems at the University Klagenfurt, Austria. His research focuses mainly on various aspects of semantic systems, including knowledge representation and reasoning, machine learning for computer vision and natural language processing, knowledge acquisition and maintenance, as well as logic programming and reasoning techniques. Schekotihin authored more than 70 papers published in prestigious AI conferences and leading international journals. Christian Burmer joined Siemens Corp. in 1986 and developed laser-based methods and tools for micromanipulation on semiconductor devices. Since 1992, he has worked in the failure analysis department at Infineon Technologies. His focus is on localization strategies in logic and mixed-signal designs, and he is an author and co-author of several papers on software-based fault localization and related topics. He gave tutorials on fault localization both company internal and during the ETS and GMM symposia. He is involved in projects developing software applications for failure analysis, focusing on extracting information using AI methods. Christian Hollerith is a principal engineer in the failure analysis department of Infineon in Munich, with expertise in the fields of nanoprobing, SEM, and SAM. He also supports several failure analysis-related digitalization topics within Infineon and works within the EU-funding project FA4.0. Hollerith studied physics at TU Munich from 1996 to 2001. His Ph.D. thesis was about the application of transition edge sensors for EDS and he earned his diploma in 2006. He developed a high-resolution, low-temperature EDS system for FA usage at the FA lab of Infineon at Munich Perlach. Subsequently, he joined FA lab Munich of Infineon as part of the FA-team for communication products. In this position, he was involved over the years in developments in the fields of SAM, SEM, nanoprobing, mechanical preparation of warped surfaces, tester-based localization, and package modification. Xue Ming is a senior principal of failure analysis at Infineon Technologies with 39 years of electronics/semiconductor industrial experience: 10 years as RF designer/project manager, 4 years of PCBA process engineer, 26 years as head of Singapore FA, and senior principal and key technical staff in Infineon FA and BE. He gives FA courses at Infineon and international conferences, and is an author of 52 papers and 10 patents. NOTEWORTHY NEWS ITC 2023 The International Test Conference (ITC) will be held October 8-23 at Disneyland in Anaheim, Calif. At ITC, test and design professionals will confront the challenges the industry faces and learn how these issues are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. ITC is sponsored by the IEEE. For more information, visit itctestweek.org.
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