edfas.org 1 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 2 DEPARTMENTS Fundamentals of Circuit Edit David Akerson This article discusses the basics of focused ion beam (FIB) circuit edit and its benefits and provides tips to those new to circuit edit. Author Guidelines Author guidelines and a sample article are available at edfas.org. Potential authors should consult the guidelines for useful information prior to manuscript preparation. 4 9 A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS MAY 2023 | VOLUME 25 | ISSUE 2 edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS 2 GUEST EDITORIAL Felix Beaudoin, Renee Parente, and James Demarest 30 2023 PHOTO CONTEST 31 2023 VIDEO CONTEST 32 EDUCATION NEWS 33 UNIVERSITY HIGHLIGHT Konstantin Schekotihin 34 DIRECTORY OF FA PROVIDERS Rosalinda Ring 36 TRAINING CALENDAR Rosalinda Ring 38 LITERATURE REVIEW Michael R. Bruce 40 PRODUCT NEWS Ted Kolasa 44 GUEST COLUMN Nicholas Antoniou and Brendan Foran 48 ADVERTISERS INDEX Artificial Intelligence Applications in Semiconductor Failure Analysis Anna Safont-Andreu, Konstantin Schekotihin, Christian Burmer, Christian Hollerith, and Xue Ming Artificial intelligence can significantly change the way FA labs perform daily operations as well as increase impact on the global organizational level. 16 For the digital edition, log in to edfas.org, click on the “News/Magazines” tab, and select “EDFA Magazine.” Whole-Chip Delayering for Failure Analysis and Quality Assurance David Douglass and Kyle Godin Broad ion beam delayering is a versatile technique for whole-chip failure analysis. The large area of unifor- mity coupled with the ability to precisely stop at the layer of interest enables repeatable, rapid whole-chip defect detection. 9 4 ABOUT THE COVER The metal short in this STEM image resembles a bull or buffalo with horns. Photo by Joshua Chang, Micron, First Place Winner in Black and White Images, 2022 EDFAS Photo Contest. 16
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