A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS NOVEMBER 2022 | VOLUME 24 | ISSUE 4 ELECTRONIC DEVICE FAILURE ANALYSIS edfas.org ACCURATE CALIBRATION FOR SPECTRAL PEM SECURITY ASSESSMENT OF NVM AGAINST PHYSICAL PROBING THINNING AND POLISHING HIGHLY WARPED DIE MEMORY PUF-BASED METERING OF FPGAs 4 22 12 34
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