edfas.org 1 1 ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 24 NO . 4 12. N. Herfurth: Extractionof photon emission spectra, Available: https:// docs.google.com/spreadsheets/d/1-g2oMWFn5OB8ME6LACUttBj1gRBlCINT/edit?usp=sharing&ouid=112348371872980361591&rtp of=true&sd=true. 13. R. Soref and B. Bennett: “Electrooptical Effects in Silicon,” IEEE J. Quantum Electron., 1987, Vol. 23, No. 1, p. 123–129, doi: 10.1109/ JQE.1987.1073206. 14. Refractive index library, Available: https://www.pvlighthouse.com. au/refractive-index-library. 15. M.A. Green: “Self-consistent Optical Parameters of Intrinsic Silicon at 300K including Temperature Coefficients,” Solar Energy Materials and Solar Cells, 2008, Vol. 92, No. 11, p. 1305-1310, doi: 10.1016/j. solmat.2008.06.009. 16. M. Fox: Optical properties of solids, 2nd ed. New York: Oxford University Press, 2010. 17. Beer–Lambert law: Available: https://en.wikipedia.org/wiki/ Beer%E2%80%93Lambert_law. 18. A. Toriumi, et al.: “A Study of Photon Emission from n-channel MOSFET’s,” IEEE Trans. Electron Devices, 1987, Vol. 34, No. 7, p. 15011508, doi: 10.1109/T-ED.1987.23112. ABOUT THE AUTHORS Norbert Herfurth received his M.Sc. in electrical engineering (microelectronics) in 2013 and his Dr.-Ing. in semiconductor failure analysis from TU Berlin in 2020. From 2013 to 2019, he conducted research and worked in the field of failure analysis for semiconductor devices at TU Berlin’s Department of Semiconductor Devices. Since 2020, he has worked at IHP Frankfurt (Oder) in the Technology department as a post-doc and project coordinator in the area of hardware security and open-source activities. Christian Boit retired in 2018 as chair of the Semiconductor Devices Department at Technische Universitaet Berlin, Germany. His research focuses on IC failure analysis (FA) and contactless fault isolation (CFI). In recent years, he was also investigating hardware security risks introduced by CFI. Boit started at Siemens Semiconductors in 1986 and from 1990 to 1993 participated in the IBM/Siemens DRAM project. Later, he was director of FA at Infineon Technologies until taking the university position in 2002. Boit is an active supporter of the FA community. He was co-founder and member of the board of directors of EDFAS, served in many conference committees, and was general chair of major electronic device FA conferences ISTFA 2002 and ESREF 2014. NOTEWORTHY NEWS IEDM 2022 The 68th International Electron Devices Meeting (IEDM) will take place December 3-7 at the Hilton San Francisco Union Square. IEDM is a leading forum for reporting breakthroughs in the technology, design, manufacturing, physics, and modeling of semiconductors and other electronic devices. Topics of interest include circuit and device interactions; characterization, reliability, and yield; compound semiconductor and high-speed devices; memory technology; modeling and simulation; nano device technology; optoelectronics, displays, and imagers; power devices, process and manufacturing technology, and sensors, MEMS, and BioMEMS. IEDM is sponsored by the IEEE Electron Devices Society. For more information, visit ieee-iedm.org and watch for any updates to the meeting plan.
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