August_EDFA_Digital

edfas.org ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 24 NO . 3 54 THE WORLD’S FIRST SPECTRAL CT ANALYTICAL COMPOSITION CAPABILITY Tescan Orsay Holding announces the first spectral CT analytical capability formicro-CT systems. Spectral CTpro- vides chemical information at any point inside a sample, complementingTescan’s stateof the art structural imaging capabilities. With spectral CT, materials scientists can now see the most subtle changes inmaterial composition and purity, and low contrast materials such as polymers can be differentiated fromeach other, something not possible using micro-CT alone. “Spectral CT is Tescan’s unique, cutting-edge technol- ogy that greatly expands the capabilities of our micro- CT product portfolio,” says Wesley De Boever, Tescan’s product marketing manager. “Micro-CT provides excel- lent structural information, and now, using spectral CT, our customers can understand what is in their samples, identify anddifferentiate chemical compounds andunder- stand their concentration and density. It is not possible to absolutely identify chemical compositionwith traditional, absorption based micro-CT.” Spectral CT is unique in that it not only measures how many x-rays are stopped by a sample, but it also counts the individual x-ray photons. By dividing these photons based on their energy in different bins the spectrum can be analyzed, enabling the attenuation coefficient of the sample to be precisely calculated. This allows the user to calculate densities and see contrast between different materials that are invisible using traditional micro-CT. The user can also identify unknownminerals based on k-edge imaging, removeartefacts fromtraditional CT scans, or cal- culate concentrations of different substances in a sample. Spectral CT is an option that is available with Tescan’s UniTOM XL, a versatile, multiscale micro-CT system for high throughput experiments on a diverse range of samples, andCoreTOM, formultiscalemicro-CT investiga- tions in earth sciences. It can be added to existing UniTOM XL or CoreTOM instruments without compromising any of the system’s features. It is a complete hardware/soft- ware solution that is integrated into the micro-CT system for extreme ease of use, with only one click needed to switch between structural and spectral information. A full software suite features acquisition, reconstruction, and analysis of spectral data. For more information, visit www.tescan-orsay.com . INTEGRA TECHNOLOGIES ANNOUNCES GRAND OPENING OF WICHITA ANALYSIS LAB Integra Technologies, aworld leader in semiconductor packaging, assembly, test, characterization, and related services, announced the grand opening of its Analysis Lab at the company’s headquarters in Wichita, Kansas. The state-of-the-art 2700 sq-ft lab expansionwill house 15 new pieces of specialized test equipment allowing for 150 projects to be run at the new lab per week. Onsite destructive physical analysis (DPA) will give Integra the ability to reduce the time needed to complete component qualifications that directly impact time to market, allow- ing customers to pull in schedules to meet the nation’s demand for qualified microelectronics. Brett Robinson, Integra Technologies president and CEO says, “the $2million plus capital investment furthers Integra’s commitment to support the nation’s infrastruc- ture by providing service to the Department of Defense and space customers.” The new lab will bring approximately 40 engineering positions and non-technical operator positions. As DPA processes are unique to Integra in Wichita, Integra will provide onsite training to develop the expertise needed to operate the equipment and perform the analyses. DPA is a systematic, logical, and detailed analysis of electronic components during various stages of disas- sembly to obtain information about the quality of the component, and is used to identify potential reliability concerns associated with the parts based on industry standard informationandcharacteristics of device failures. Physical analysis allows end users to select parts that will reliably perform as designed in their critical applications for their intended life. For more information, visit www.integra-tech.com . TrueContrast spectral CT provides differentiation between phases that traditional micro-CT (top left) cannot differentiate. In a single scan, five different chemical compositions can be identified in this sample.