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edfas.org ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 24 NO . 3 40 Katie Matusik is a senior systems engineer at Sigray, focusing on the development of the com- pany’s 3D x-ray microscope, a low-energy high-resolution x-ray nanotomography system. Previous to Sigray, Katie worked as an assistant physicist at the Advanced Photon Source (APS) at Argonne National Laboratory, providing user support at the 7-BM beamline. David Vine graduated with a Ph.D. from Monash University in 2008. He currently works as the product manager for x-ray microscopy overseeing the development of the TriLambda nanoscale CT and Prisma sub-micron absorption and TriContrast CT systems. Sylvia Lewis co-founded Sigray Inc. and has spent over a decade in advanced x-ray instrumenta- tion. She has led the company’s development of applications for its suite of x-ray tools and the com- pany’s patent strategy. She completed her undergraduate degree at Stanford University in electrical engineering. Wenbing Yun is a leading researcher in x-ray imaging, an innovator, a serial entrepreneur, and OSA fellow. After the Zeiss acquisition of Xradia Inc., which he founded, Yun started Sigray Inc. with a mission to make accessible the entire portfolio of synchrotron analytical techniques to laboratories worldwide. NOTEWORTHY NEWS NANOTS 2022 The 42nd annual NANO Testing Symposium (NANOTS 2022) will be held November 8-10 at Senri Life-Science Center, in Toyonaka, Osaka, Japan. NANOTS is one of the leading technical symposiums for discussing solutions that improve the testing process of nanoscale devices and materials. NANOTS is sponsored by the Institute of NANO Testing in cooperation with the Institute of Electronics, Information and Communication Engineers, the Japan Society of Applied Physics, the Reliability Engineering Association of Japan, and the Union of Japanese Scientists and Engineers. For more information, visit the NANOTS website at www-nanots.ist.osaka-u.ac.jp. HIGH SPEED X-RAY TOMOGRAPHY WITH SUBMICRON RESOLUTION FOR FA (continued from page 37) Whether networking at events or accessing information through EDFA , ISTFA proceedings, or journals, our members have the edge. Now it’s time to introduce EDFAS to others in the industrywhowould like to take advantage of these career- enhancing benefits. Help us help the industry by expanding our membership and offering others the same exceptional access to information and networking that sets EDFAS apart. To reacquaint yourself with and introduce others to the EDFAS member benefits, visit asminternational.org/web/edfas/membership. EDFAS MEMBERSHIP