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edfas.org ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 24 NO . 2 42 DIRECTORY OF INDEPENDENT FA PROVIDERS Rosalinda M. Ring, Howard Hughes Research Labs LLC jmj4papa@yahoo.com E lectronic companies of all types and sizes require failure analysis (FA) services. Our goal is to supply a resource of FA service providers for your reference files. The directory lists independent providers and their contact information, expertise, and types of technical services offered. ADVANCED MICROANALYTICAL 50A Northwestern Dr., Unit #4 Salem, NH 03079 877.605.6662 info@advancedmicroanalytical.com advancedmicroanalytical.com ServicesOffered: Comparative testing lab, compositional analysis, destructive physical analysis (DPA), engineering support, environmental monitoring, failure analysis, fire investigative/combustion byproduct, inspection services, integratedcircuit support,materials characterization,met- allurgical testing services, nanomaterials, nondestructive testing, particle testing, particulate micro analysis (PMA), power generationandparticle emissions analysis, product development R&D, product/process validation, quality assurance, and unknown material identification. Tools and Techniques: Cross-sectional analysis, CSAM, EBSD, EDS/elemental mapping, FIB-SEM, GC/GC-MS, GD-OES, hardness/microhardness testing, ICP-MS & ICP- OES, micro-FTIR, micro-Raman, NMR, optical microscopy, particle size distribution test, physical & mechanical testing, SEM, surface analysis & profilometry, TEM, XPS, x-ray imaging/3D x-ray CT, XRD, and XRF. CERIUM LABS 5204 East Ben White Blvd. Bldg. 1, mailstop 512 Austin, TX 78741 866.770.7752 sales@ceriumlabs.com ceriumlabs.com/analytical-techniques Services Offered: Manufacturing support, raw materials qualification, and advanced material research. Tools and Techniques: Atomic force microscopy (AFM), gas chromatography-mass spectroscopy (GC-MS), elastic recoil detection analysis (ERDA), FIB, FTIR, ion chromatography (IC), ICP-MS, vapor phase decomposi- tion (VPD-)ICP-MS, ICP-OES, neutron activation analysis (NAA), nuclear reaction analysis (NRA), particle induced x-ray emission (PIXE), Raman spectroscopy, Rutherford backscattering (RBS), SEM/EDS, secondary ion mass spectroscopy (SIMS), TEM/STEM – EDS/EELS, TXRF – total x-ray fluorescence (TXRF), TOC, x-ray photoelectron spec- troscopy (XPS – ESCA), and x-ray analysis – diffraction/ reflectivity (XRD-XRR). INTEGRA TECHNOLOGIES 3450 N. Rock Rd., Bldg #100 Wichita, KS 67226 316.630.6800 1635 McCarthy Blvd. Milpitas, CA 95035 408.618.8700 10401 Research Rd. SE Albuquerque, NM 87123 505.299.1967 sales_inquiry@integra-tech.com integra-tech.com/facilities Services Offered: Package laser ablation, destructive physical analysis (DPA), failure analysis, and counterfeit detection. Tools and Techniques: Control laser decapsulation FALIT laser ablation system, root cause FMA (layer-by-layer root cause failure mode analysis), construction analysis, EDX and XRFmaterial analysis, CSAM (C-mode scanning acous- tic microscopy), PIND (particle impact noise detection), x-ray real time and 3D x-ray, x-ray fluorescence analysis, SEAL fine and gross leak testing, bond pull and die shear, ball shear, copper wire evaluations, FIB editing, backside inspection, physical dimension, marking permanency, AC, DC, full functional electrical test, -150 to 200°C tem- perature test, decap, internal visual inspection, OEMdate code verification, blacktop test, burn-in qualification, and solderability testing. MASER ENGINEERING B.V. Capitool 56, 7521 PL Enschede The Netherlands +31.53.480.26.80