February_EDFA_Digital

edfas.org 51 ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 24 NO . 1 EDUCATION NEWS Bhanu P. Sood, NASA Goddard Space Flight Center bhanu.sood@nasa.gov SPOTLIGHT ON TUTORIALS T he EDFAS Education Subcommittee strives for the development and delivery of educational products to theEDFASmembership. Keepingwith its strategic focus on reaching a broader audience, including facilitat- ing Q&A and educational exchanges on the ASM Connect platform, the Subcommittee has recently started inviting ISTFA tutorial speakers to present short format presenta- tions on selected FA topics. These presentations are now available on ASMConnect. Use the following link: https:// bit.ly/3mCn7m6 and click on the Educational Tutorials folder. An ASM Connect login is required. For this issue, we are highlighting a tutorial by Steven Voldman on electrical overstress (EOS) and electrostatic discharge (ESD) failure mechanisms. In EOS and ESD phenomena, the failure mechanism is a function of the EOS and ESD event, as well as the technology, mate- rial properties, structure, circuit, or system. The tutorial shows ESD and EOS failure models and physical models (e.g., Wunsch-Bell, Tasca, etc.), and ESD tests (e.g., HBM, MM, TLP, VF-TLP, CDM, and IEC 61000-4-2) and how they related to the failure events. The tutorial addresses ESD failuremechanismsof advancedCMOS, siliconon insulator and silicon germanium technologies as well as MEMs, to magnetic recording devices. Voldman’s presentation can be accessed using the following link: https://bit.ly/3oP5RL5. For additional information on the EDFAS Education Subcommittee, contact Bhanu Sood at bhanu.sood@ nasa.gov. Slides from Steven Voldman’s tutorial show examples of EOS and ESD failure mechanisms.