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edfas.org ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 24 NO . 1 16 ABOUT THE AUTHORS Nigel Browning is currently the chair of ElectronMicroscopy in the School of Engineering and the School of Physical Sciences and Director of the Albert Crewe Centre for Electron Microscopy at the University of Liverpool (since 2017). He has over 30 years of experience in the development of new methods in electron microscopy for high spatial, temporal, and spectroscopic resolution analysis of materials. He is a Fellow of the American Association for the Advancement of Science and the Microscopy Society of America. He received the Burton Award fromtheMicroscopy Society of America in 2002 and theCoble Award fromthe AmericanCeramic Society in 2003 for the development of atomic resolution methods in scanning transmission electron microscopy. With his collaborators at LLNL, he also received R&D 100 and Nano 50 Awards in 2008, and a Microscopy Today Innovation Award in 2010 for the development of the dynamic transmission electron microscope. He has over 400 peer reviewed publications and has given over 300 invited presentations on electron microscopy methods. Daniel Nicholls is a fourth year Ph.D. student at theUniversity of Liverpool, with amaster’s degree in physics. His research focuses on the development and application of compressive sensingmethods to reduce beam damage and increase acquisition speed and quality in electron microscopy. JackWells is a second year Ph.D. student at theUniversity of Liverpool with a master’s degree in physics. His research focuses on the development of software solutions andmethods for electronmicroscopy using compressive sensing and machine learning. AlexW. Robinson is a secondyear Ph.D. student at theUniversity of Liverpool, with a master’s degree in theoretical physics. His research is aimed at develop- ing new methods in electron microscopy, with a focus on low-dose and high- resolution imaging of battery materials. 10. M. Zhou, et al.: “Nonparametric Bayesian Dictionary Learning for Analysis of Noisy and Incomplete Images,” IEEETransactions on Image Processing, 2012, 21, p. 130-144. 11. A. Criminisi, P. Perez, and K. Toyama: “Region Filling and Object Removal by Exemplar Based Image Inpainting,” IEEE Transactions on Image Processing, 2004, 13, p. 1200-1212. Advertise in Electronic Device Failure Analysis magazine! For information about advertising in Electronic Device Failure Analysis: Kelly Johanns, Business Development Manager 440.318.4702, kelly.johanns@asminternational.org Current rate card may be viewed online at asminternational.org/mediakit.