February_EDFA_Digital

edfas.org 1 ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 24 NO . 1 DEPARTMENTS Optimal Sampling and Reconstruction Strategies for Scanning Microscopes N.D. Browning, D. Nicholls, J. Wells, and A.W. Robinson This article examines themain issues associatedwithmini- mizing beam dose in the STEM and proposes the use of a sub-sampling and inpainting methodology to overcome the effects of the beam. Author Guidelines Author guidelines and a sample article are available at edfas.org. Potential authors should consult the guidelines for useful information prior to manuscript preparation. 3 11 A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS FEBRUARY 2022 | VOLUME 24 | ISSUE 1 edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS 2 GUEST EDITORIAL Nicholas Antoniou 36 PANEL & USER GROUP SUMMARY 43 2021 EDFAS AWARD WINNERS 44 2022 EDFAS AWARDS 45 CALL FOR NOMINATIONS Lee Knauss 46 BOARD OF DIRECTORS NEWS Renee S. Parente 47 DIRECTORY OF FA PROVIDERS Rosalinda Ring 48 TRAINING CALENDAR Rosalinda Ring 49 LITERATURE REVIEW Michael R. Bruce 50 PRODUCT NEWS Ted Kolasa 51 EDUCATION NEWS Bhanu P. Sood 52 ADVERTISERS INDEX Simultaneous Local Capacitance-Voltage Profiling and Deep Level Transient Spectroscopy using tr-SNDM Yasuo Cho Time-resolved scanning nonlinear dielectric microscopy (tr-SNDM) is a highly effective technique for the precise quantitative analysis of semiconductor materials and devices. 17 For the digital edition, log in to edfas.org , click on the “News/Magazines” tab, and select “EDFA Magazine.” Determination of Indenter Crack Probability on Multilayer Stacks using an Acoustic Emission Test Method Marianne Unterreitmeier and Oliver Nagler A recently developed acoustic emission test detectsmate- rial defects inmultilayer semiconductor structures in real- time during wafer probing. 11 3 17 29 Scanning Nitrogen Vacancy Magnetometry: A Quantum Technology for Device Failure Analysis Peter Rickhaus and Patrick Maletinsky Scanning NV microscopy is not only suited to measure tiny magnetic fields, it can also resolve electrical cur- rents with unprecedented spatial resolution. 29 ABOUT THE COVER The color image of a NAND flash device containing eight stackeddice. The imagewas taken on a LeicaM165C stereo microscope after chemical decapsulation. Photo by Kevin Awai, Raytheon, First Place Winner in Color Images, 2021 EDFAS Photo Contest. ISTFA Wrap Up 33 A recap of the ISTFA 2021 event includes General Chair Susan Li's wrap-up as well as a list of the winning ISTFA papers and posters.