November_EDFA_Digital

edfas.org ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 23 NO . 4 56 EDUCATION NEWS Bhanu P. Sood, NASA Goddard Space Flight Center bhanu.sood@nasa.gov SPOTLIGHT ON TUTORIALS T he EDFAS Education Subcommittee is committed to the development and delivery of educational products to the EDFAS membership. Keeping with its strategic focus on reaching a broader audience, includ- ing facilitatingQ&Aandeducational exchanges on the ASM Connect platform, the Subcommittee has recently started inviting ISTFA tutorial speakers to present short format presentations on selected FA topics. These presentations are nowavailable on ASMConnect. Use the following link: https://bit.ly/3mCn7m6 and click on the Educational Tutorials folder. An ASM Connect login is required. For this issue, we are highlighting defect localization by lock-in-thermography (LIT), which, in recent years has emerged into a powerful technique for the detection and localization of thermally active electrical defects inmicro- electronic devices. Due to its averaging nature, this tech- nique allows the detection of local heat sources of a few μWdissipation power corresponding to local temperature alterations in the lowμK-range. Thus, it outperforms other thermal imagingmethods, like liquid crystal imaging, fluo- rescent microthermal imaging, Raman IR-thermography, and steady state IR thermography by 2 to 3 orders of mag- nitude. Due to the ability of thermal energy to penetrate and propagate through optically opaque materials, LIT is a powerful technique for the nondestructive detection and localization of buried defects in packaged devices. The tutorial, delivered by Sebastian Brand, introduces the basic principles of direct IR imaging, LIT, and specific advances of the techniques for improving sensitivity and lateral imaging resolution. Further, the fundamentals of the individual techniques are illuminated along with demonstrations based on selected representative failure analysis case studies addressing die level hot spot local- ization. The tutorial can be accessed using the following link: https://bit.ly/2UV9TFO. For additional information on the EDFAS Education Subcommittee, contact Bhanu Sood at bhanu.sood@ nasa.gov. Hot spot localization at a decapsulated device (left) and a packaged stacked die device (right).