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edfas.org ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 23 NO . 4 52 LITERATURE REVIEW T his column covers peer-reviewed articles published since 2019 on optoelectronic devices, solar cells, photovoltaics, and light emitting diodes (LEDs). Note that inclusion in this list does not vouch for the article’s quality and category sorting is by no means strict. If you wish to share an interesting, recently published peer-reviewed article with the community, please forward the citation to the above email address and I will try to include it in future installments. Entries are listed in alphabetical order by first author, then title, journal, year, volume, and first page. Note that in some cases bracketed text is inserted into the title to provide clarity about the article topic. Peer-Reviewed Literature of Interest to Failure Analysis: Optoelectronic Devices, Solar, Photovoltaics, LEDs Michael R. Bruce, Consultant mike.bruce@earthlink.net • M.R. Aboelmagd, A.A.Z. Diaborcid, and G.M. Dousokyorcid: “Failure Analysis in Photovoltaic Power Systems Using an Artificial Neural Network,” J. Adv. Eng. Trends, 2021, 41, p. 205. • R. Asadpour, D.B. Sulas-Kern, S. Johnston, et al.: “Dark Lock-in Thermography Identifies Solder Bond Failure as the Root Cause of Series Resistance Increase in Fielded Solar Modules,” IEEE J. Photovolt., 2020, 10 (5), p. 1409. • X. Guo and J. Cai: “Optical Stepped Thermography of Defects in Photovoltaic Panels,” IEEE Sensors J., 2021, 21, p. 490. • M.J. Hossain, E.J. Schneller, M. Li, et al.: “Incorporation of Spatially-resolved Current Density Measurements with Photoluminescence for Advanced Parameter Imaging of Solar Cells,” Sol. Energy Mater. Sol. Cells, 2019, 199, p. 136. • B. Lipovšek, F Smole, M Topič, et al.: “Driving Forces and Charge-carrier Separation in p-n Junction Solar Cells,” AIP Advances, 2019, 9, p. 055026. • C. Peng, F. Ding, Z. Lei, et al.: “Investigation of Radiation-induced Degradations in Four-junction Solar Cell by Experiment and Simulation,” Microelectron. Reliab., 2020, 108, p. 113646. • M.M. Rahmana, I. Khanb, and K. Alameh: “Potential Measurement Techniques for Photovoltaic Module Failure Diagnosis: A Review,” Renewable Sustainable Energy Rev., 2021, 151, p. 111532. • J. Selvidge, J. Norman, R. Herrick, et al.: “Non- radiative Recombination at Dislocations in InAs Quantum Dots Grown on Silicon,” Appl. Phys. Lett., 2019, 115, p. 131102. • P. Songs, F. Yang, J. Liu, et al.: “Lock-in Carrier- ography Non-destructive Imaging of Silicon Wafers and Silicon Solar Cells,” J. Appl. Phys., 2020, 128, p. 180903. • W. Tang, Q. Yang, K. Xiong, et al.: “Deep Learning Based Automatic Defect Identification of Photovoltaic Module using Electroluminescence Images,” Solar Energy, 2020, 201, p. 453. • T.W. Teo, Z. Mahdavipour, and M.Z. Abdullah, et al.: “[Review:] Recent Advancements in Micro-crack Inspection of Crystalline Silicon Wafers and Solar Cells,” Meas. Sci. Technol., 2020, 31, p. 081001. • M. Vaqueiro-Contreras, V.P. Markevich, J. Coutinho, et al.: “Identification of the Mechanism Responsible for the Boron Oxygen Light Induced Degradation in Silicon Photovoltaic Cells,” J. Appl. Phys., 2019, 125, p. 185704; also see J. O’Mahony, “Defect Behind Early Degradation of Solar Cells Revealed,” 21 Jun 2019, Phys. Today Res. Tech., DOI:10.1063/PT.6.1.20190621a. • M. Waqar, A.G. Li, Y. Jin, et al.: “Improved Outdoor Thermography and Processing of Infrared Images for Defect Detection in PV Modules,” Solar Energy, 2019, 190, p. 549.