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edfas.org 45 ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 23 NO . 4 BOARD CANDIDATE PROFILES PROFILES OF CANDIDATES FOR THE EDFAS BOARD OF DIRECTORS Lee Knauss, Chair, EDFAS Awards & Nominations Committee knauss_lee@bah.com T he EDFASBoardof Directors unanimously approved one reappointed member and one new member with terms beginning in 2021. Members-At-Large 2021-2024 • Tom Schamp (Reappointed) • David Grosjean Congratulations to these new board members. Tom Schamp is a principal con- sultingscientist andprincipal investi- gator at Materials Analytical Services LLC headquartered in Suwanee, Ga. His failure analysis (FA) background grew out of his engineering roles at Spansion/Cerium Labs and SVTC/ Novati Technologies where hewas a leadTEManalyst andmaterials scientistworkingwith FAB- based and external engineers to troubleshoot problems, develop design of experiments, develop and implement TEM/STEM capabilities, and manage projects. Later, as a senior product specialist at Hitachi High Technologies America, Schamp supported customers throughdemonstrations, training, and techniquedevelop- ment. Today, he utilizes his FA background to help plan and manage customer projects in the service lab space. Before joining Spansion, he received his B.S. in math and physics from Lynchburg College (now University of Lynchburg) and received his M.S. and Ph.D. in materials science and engineering from the University of Virginia. Schamp’s volunteerism with EDFAS includes serving a term on the EDFAS board, the Lonestar EDFAS chapter board, and on the editorial board for the Electronic Device Failure Analysis ( EDFA ) magazine. In addition, he has been a presenter, reviewer, and session co-chair for themicros- copy sessions at ISTFA. Vision Statement “I see EDFAS as a strong resource not only for the semiconductor FA community, but also for those outside of it. The wide range of techniques and methodologies utilizedwithin the FA community fromSPC tomicroscopy to simulations are useful for general materials analyses and characterization. A tremendous strength of the EDFAS community is the openness to share techniques and new technologies. “Where I see the greatest potential benefits to EDFAS is in continuing the efforts to grow the accessibility of the community’s knowledgebase beyond the ISTFA confer- ence. The pandemic has forced a step-function improve- ment in virtual accessibility, which I think we can build on tocontinue to transformEDFAS intoaknowledgeplatform. This shift will enable person-to-person and person-to- community interactions, as well as provide technical content in the form of accessible historical publications and video-based content—all readily accessible to the EDFAS community.” David Grosjean has been work- ing in semiconductors andMEMS for 25 years in various roles, including failure analysis, yield enhancement, defect reduction, and reliability physics, at various companies includ- ingNEC, AnalogDevices, Qualcomm, and Butterfly Network, where he is currently the FA Manager. He received a B.S. in applied