November_EDFA_Digital

edfas.org ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 23 NO . 4 38 EDFAS AWARDS SEEKING NOMINATIONS FOR EDFAS AWARDS The ASM Electronic Device Failure Analysis Society established two awards to recognize the accomplishments of its members. The awards will be given at ISTFA 2022. Nominate a worthy colleague today! EDFAS LIFETIME ACHIEVEMENT AWARD The EDFAS Lifetime Achievement Award was established by the EDFAS Board of Directors in 2015 to recognize leaders in the EDFAS community who have devoted their time, knowledge, and abilities to the advancement of the electronic device failure analysis industry. EDFAS PRESIDENT’S AWARD The EDFAS President’s Award shall recognize exceptional service to EDFAS and the electronic device failure analysis community. Examples of such service include, but are not limited to committee service, service on the Board of Directors, organization of conferences or symposia, development of education courses, student and general public outreach. While any member of EDFAS is expected to further the Society’s goals through service, this award shall recognize those who provided an exceptional amount of effort in their service to the Society. Nomination deadline for both awards is March 1, 2022. For rules and nomination forms, visit the EDFAS website at edfas.org, click on Membership & Networking and then Society Awards, or contact Mary Anne Jerson at 440.671.3877, maryanne.jerson@asminternational.org EDFAS MEMBERS RECEIVE ASM AWARDS T he Electronic Device Failure Analysis Society (EDFAS) is proud to announce that two of its members have been named as recipients of 2021 ASM Awards. ASM FELLOWS Dr. James J. Demarest, FASM, senior engineer, IBM, Rensselaer, N.Y., was named to the 2021 Class of Fellows of ASM International. He was cited “for the development of innovative transmission electron microscopy image analysis, strain measurement, and automation techniques that enable significant semiconductor technological advancement and yield improvement, as well as for men- toring, teaching, and empowering career growth for students and engineers.” Dr. Philip V. Kaszuba, FASM, senior member technical staff (retired), GlobalFoundries Inc., Essex Junction, Vt., was also selected as a Fellow of ASM International. His award was “for pioneering work in scanning probe microscopy that established a foundation for the way semiconductors are analyzed today and for leadership and sustained level of innovation and invention that advanced the state-of-the-art.” Demarest and Kaszuba join Larry Wagner (2010), Ed Cole (2013), Bill Vanderlinde (2014), Cheryl Hartfield (2017), Dehua Yang (2018), Felix Beaudoin (2019), Richard McSwain (2019), Janez Grum (2020), Virginia Osterman (2020), and Michael Pecht (2020) as EDFAS members selected for this honor.