May_EDFA_Digital

edfas.org ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 23 NO . 2 44 info@iec-electronics.com www.iec-electronics.com/services/analysis-testing-lab ServicesOffered: Root cause failure analysis, authenticity testing, and reliability and qualification services. Tools and Techniques: Mechanical testing (mechanical shock testing, resistance to solvent testing, solderability testing), environmental testing (accelerated bias aging, cyclic moisture resistance, highly accelerated stress test- HAST, moisture reflow sensitivity level testing, steam aging), component analysis (ball/die shear strength, particle impact noise detection, C-scanning acoustic microscopy, real-time x-ray), material/surface analysis (micro-FTIR spectroscopy, SEM/EDS, XRF, FTIR), and her- meticity testing (fine/gross leak). INSIGHT ANALYTICAL LABS INC. 11641 Ridgeline Dr., Unit 150 Colorado Springs, CO 80921 719.570.9549 www.ial-fa.com/failure-analysis/analytical-techniques Services Offered: Electronics failure analysis, reverse engineering, construction analysis, and inspection services. Tools andTechniques: X-ray inspection, 2D real-time, and 3D, SAM (including c-mode scanning), optical inspection (dark field, bright field, polarized, high-resolution Mosaic functionality), electrical test equipment, infraredmicros- copy, x-ray fluorescence, Fourier transform infrared, EDS, hi-pot and insulation resistance testing, cross sectioningof ICs and PCBs (mechanical and FIB), FIB editing, SEM and FE-SEM, parallel lapping, dry and wet etching, reactive ion etching, STEM prep and imaging, dye and pry (BGA devices), decapping and depotting (ICs), solderability analysis, PEM, liquid crystal analysis, LIVA/TIVA analysis, thermal imaging and electrical probing. JH TECHNOLOGIES Analytical Lab Services 213 Hammond Ave. Fremont, CA 94539 408.436.6336 info@jhtechnologies.com www.jhtechnologies.com/jh-analytical-services Services Offered: Sample preparation formaterial analy- sis, optical image analysis, SEMsample preparation, x-ray, hardness testing, SEM imaging and analysis, repair, main- tenance, training, and process optimization. Tools and Techniques: X-Scope 3000 x-ray inspection system, Leica DMi8 M inverted microscope, Leica DVM 6 digital microscope, Apreo ‘S’ SEM, SEM/Oxford EDS, Leica DM4Mupright materialsmicroscope, Leica-M205-C- Stereo-Microscope, Lax-X-imaging, Leica ApplicationSuite X (LASX), OmniMet Software, VibroMet 2VibratoryPolisher, Petro Thin SectionMachine, Leica TIC 3x Ion BeamMilling System, Leica EM TXP Target Preparation Device, Leica ACE 600 High VacuumSputter Coater, andWilson VH 1202 Micro Hardness Testers. NANOTECH ANALYTICAL SERVICES AND TRAINING CORP. (NASAT LABS) Lot 1, Block 136 C. Arellano Poblacion, Muntinlupa 1770 Metro Manila, Philippines 02.7576.8922 0908.885.6051 nasatlabs.com Services Offered: Failure analysis and materials charac- terization, water and environmental testing, and technical trainings. Tools and Techniques: SEM, EDS, AFM, IR-OBIRCH analy- sis, XRF, EBSD, videomeasuringmachine, differential scan- ning calorimetry, thermo gravimetric analysis, thermal emissionmicroscopy, mechanical cross section, grinding and polishing, hybrid ion milling (cross-section and flat milling), and ion sputtering. QUANTUM FOCUS INSTRUMENTS CORP. Vista California Laboratory 2385 La Mirada Dr. Vista, CA 92081 760.599.1122 ext. 201 corp@quantumfocus.com Field Service and Support Contacts: 760.599.1122 ext. 201 support@quantumfocus.com Services Offered: Electrical failure analysis using QuantumScope failure analysis microscope systems, and InfraScope temperature measurement microscope systems. Tools and Techniques: QuantumScope microscope: emmi photoemission microscopy, XIVATM LSIM laser signal injection microscopy, Thermal-HS MWIR hot spot detectionmicroscopy, InfraScopemicroscope, InfraScope MWIR temperature mapping microscope, Transient-IR MWIR high-speed temperature trace option, and T Imager Thermoreflectance temperature mapping solution. SASFAB INC. Analytical Laboratory Services 509 Fairview Way Milpitas, CA 95035 408.768.7773 info@sasfab.com www.sasfab.com/analytical-services Services Offered: Materials analysis, micro-contamina- tion analysis, and materials characterization. Tools and Techniques: Air sampling, AFM, AES, electron spectroscopy (chemical analysis), EDS, FIB, FTIR, gas chromatography/mass spectroscopy, high performance liquid chromatography, ion chromatography, inductively coupledplasma/mass spectroscopy, liquidparticle count- ing, nuclear magnetic resonance spectroscopy, Raman spectroscopy, SEM, surface scan particle counting, time- to-flight secondary ion mass spectroscopy, total organic carbon analysis, TEM, and x-ray diffraction.