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edfas.org ELECTRONIC DEV ICE FA I LURE ANALYSIS | VOLUME 23 NO . 2 12 10. W. He, et al.: “Ring Oscillator under Laser: Potential of PLL-based Countermeasure Against Laser Fault Injection,” 2016 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), IEEE, 2016, p. 102–113. 11. X. Fan: “Wafer Level Packaging (WLP): Fan-in, Fan-out and Three- dimensional Integration,” 2010 11th International Thermal, Mech- anical & Multi-Physics Simulation, and Experiments in Microelec- tronics and Microsystems (EuroSimE), 2010, p. 1–7. 12. C. Xi, N. Jessurun, and N. Asadizanjani: “A Framework to Assess the Security of Advanced Integrated Circuit (IC) Packaging,” Proceed- ings - 2020 IEEE 8th Electronics System-Integration Technology Conference, ESTC 2020, no. Ic, 2020. 13. M. Bohr: “The New Era of Scaling in an SoC World,” 2009, p. 23–28. 14. J.H. Lau: “Evolution, Challenge, andOutlook of TSV, 3D IC Integration and 3D Silicon Integration,” Proceedings - International Symposium on Advanced Packaging Materials, 2011, p. 462–488. 15. C. Boit, C. Helfmeier, and U. Kerst: “Security Risks Posed by Modern IC Debug and Diagnosis Tools,” 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, IEEE, 2013, p. 3–11. 16. S. Tajik, et al.: “Emission Analysis of Hardware Implementations,” 2014 17th Euromicro Conference on Digital System Design, IEEE, 2014, p. 528–534. 17. Z. Song and L. Safran: “LVI and LVP Applications in In-line Scan Chain Failure Analysis,” Electronic Device Failure Analysis , 18, (4), 2016, p. 4–14. 18. M. Dhwani, et al.: “On the Physical Security of AI Accelerators,” International Conference on Physical Assurance and Inspection of Electronics, 2019. 19. J.-M. Schmidt, M. Hutter, and T. Plos: “Optical Fault Attacks on AES: A Threat in Violet,” 2009 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), IEEE, 2009, p. 13–22. 20. S. Skorobogatov: “Flash Memory ‘Bumping’ Attacks,” International Workshop on Cryptographic Hardware and Embedded Systems, Springer, 2010, p. 158–172. 21. H.C. Chen, et al.: “Defect Localization and Root Cause Analysis on E-fuse Read Reliability Failure,” ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, ASM International, 2014, p. 304. 22. S. Tajik, et al.: “Physical Characterization of Arbiter Pufs,” Inter- national Workshop on Cryptographic Hardware and Embedded Systems, Springer, 2014, p. 493–509. 23. F. Stellari, P. Song, M. Villalobos, and J. Sylvestri: “Revealing SRAM Memory Content Using Spontaneous Photon Emission,” 2016 IEEE 34th VLSI Test Symposium (VTS), IEEE, 2016, p. 1–6. 24. M. Lacruche, et al.: “Laser Fault Injection into SRAMCells: Picosecond Versus Nanosecond Pulses,” 2015 IEEE 21st International On-Line Testing Symposium (IOLTS), IEEE, 2015, p. 13–18. 25. M.T. Rahman, et al.: “The Key is Left Under the Mat: On the Inappropriate Security Assumption of Logic Locking Schemes,” Cryptology ePrint Archive, Report 2019/719, 2019, https://eprint. iacr.org/2019/719. ABOUT THE AUTHORS Chengjie Xi is currently a Ph.D. student at the University of Florida in the electrical and computer engineering department. He received a masters degree in materials science from the University of Florida in 2020. His research is focused on developing counterfeit detection and preventionmethods for integrated circuit designs and packaging. AslamA. Khan is currentlypursuinghis Ph.D. at theUniversityof Florida in the electrical and computer engineering department. He received amasters degree inelectrical andelectronics engineering fromtheNorfolkStateUniversity in2020. His research is focused on package security assurance and reverse engineering. M. Tanjidur Rahman is a Ph.D. student in electrical and computer engineer- ing at the University of Florida. He received his bachelors andmasters in electri- cal engineering in 2012 and 2014, respectively, from Bangladesh University of Engineering and Technology. His research interest includes hardware reverse engineering, finding vulnerabilities and root of trust verification in IC using physical inspection and attack methods. Navid Asadizanjani received a Ph.D. in mechanical engineering from University of Connecticut, Storrs, in 2014. He is currently an assistant professor with the electrical and computer engineering department at the University of Florida. His current research interest is primarily on physical attacks and inspection of electronics. This includes a wide range of products from electronic systems to devices. He is involved with counterfeit detection and prevention, system and chip-level reverse engineering, and anti-reverse engineering.