ADVANCED MATERIALS & PROCESSES | JANUARY 2026 14 CHARACTERIZATION TECHNIQUES *Member of ASM International GOOD APART, GREAT TOGETHER: ELECTRON BACKSCATTER DIFFRACTION AND X-RAY DIFFRACTION Two case studies demonstrate that gathering data from a complementary pair of materials characterization techniques can provide more valuable insights than using a single method. Laura G. Wilson,* NASA Glenn Research Center, Cleveland Richard E. Martin, HX5 LLC, Brook Park, Ohio Ayden T. McCartney,* Ohio Aerospace Institute, Cleveland Optical image of mineral samples from within the Nevada National Security Site, USA. Courtesy of NASA Glenn Research Center.
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