4 ADVANCED MATERIALS & PROCESSES | MAY/JUNE 2025 ASM International 9639 Kinsman Road, Materials Park, OH 44073 Tel: 440.338.5151 • Fax: 440.338.4634 Joanne Miller, Editor joanne.miller@asminternational.org Victoria Burt, Managing Editor vicki.burt@asminternational.org Frances Richards and Corinne Richards Contributing Editors Anne Vidmar, Layout and Design Allison Freeman, Production Manager allie.freeman@asminternational.org EDITORIAL COMMITTEE John Shingledecker, Chair, EPRI Beth Armstrong, Vice Chair, Oak Ridge National Lab Adam Farrow, Past Chair, Los Alamos National Lab Yun Bai, Ford Rajan Bhambroo, Tenneco Inc. Punnathat Bordeenithikasem, Machina Labs Daniel Grice, Materials Evaluation & Engineering Surojit Gupta, University of North Dakota Michael Hoerner, KnightHawk Engineering Hideyuki Kanematsu, Suzuka National College of Technology Ibrahim Karaman, Texas A&M University Ricardo Komai, Tesla Krassimir Marchev, Northeastern University Bhargavi Mummareddy, Dimensional Energy Scott Olig, U.S. Naval Research Lab Christian Paglia, SUPSI Institute of Materials and Construction Satyam Sahay, John Deere Technology Center India Abhijit Sengupta, USA Federal Government Kumar Sridharan, University of Wisconsin Vasisht Venkatesh, Pratt & Whitney ASM BOARD OF TRUSTEES Navin Manjooran, President and Chair Elizabeth Ho man, Senior Vice President Daniel P. Dennies, Vice President Pradeep Goyal, Immediate Past President Lawrence Somrack, Treasurer Amber Black Pierpaolo Carlone Rahul Gupta Hanchen Huang André McDonald Victoria Miller Christopher J. Misorski Dehua Yang Fan Zhang Veronica Becker, Executive Director STUDENT BOARD MEMBERS Gladys Duran Duran, Amanda Smith, Nathaniel Tomas Individual readers of Advanced Materials & Processes may, without charge, make single copies of pages therefrom for personal or archival use, or may freely make such copies in such numbers as are deemed useful for educational or research purposes and are not for sale or resale. Permission is granted to cite or quote from articles herein, provided customary acknowledgment of the authors and source is made. The acceptance and publication of manuscripts in Advanced Materials & Processes does not imply that the reviewers, editors, or publisher accept, approve, or endorse the data, opinions, and conclusions of the authors. REMEMBERING FOUR FATHERS OF METALLOGRAPHY Take a stroll through the history of materials testing and characterization by flipping through this issue of AM&P. The names of four pioneers—whose work at different time periods and in disparate parts of the globe advanced the fields of microscopy and metallography— are evoked through various articles and news items. To celebrate the 50th anniversary of the Henry Clifton Sorby Award, a two-page spread in the ASM News section shares some highlights of the award’s namesake, his contribution to the industry, and our plans to commemorate the milestone with a can’t-miss, special symposium at IMAT in Detroit this October. Sorby (1826-1908), an Englishman, was the first to view an alloy structure under a visible light microscope and invented microspectroscopy. Dubbed the first metallographer, he made the initial observation of pearlite. Since 1976, ASM’s International Metallographic Society (IMS), has been honoring excellence in metallography and materials science through the Henry Clifton Sorby Award. Another IMS recognition, the Jacquet-Lucas Award, was presented to the authors of our lead article as part of the 2024 International Metallographic Contest. The award’s current name is a meld of two previous awards. At first, ASM offered a metallographic honor that in 1958 became known as the Francis F. Lucas Grand Prize Award. Dr. Lucas (1885-1968) was a Canadian-born research microscopist who spent much of his career at Bell Telephone Laboratories in the U.S. He was best known for pioneering high power and ultraviolet microscopy. In parallel, IMS originally had an image contest with a top prize named after Pierre Jacquet (1906-1967), a French metallographer. Dr. Jacquet conducted revolutionary work on surface preparation and was known worldwide as the father of electropolishing. Many also credit him for developing the fundamental methods of electron microscopy of metals and alloys, which became the groundwork for today’s techniques. In 1972, IMS and ASM agreed to combine the two contests, resulting in the Best in Show designation used today—the Jacquet-Lucas Award—honoring the legacy of both men. While Jacquet was creating samples in a European lab, one of his contemporaries—Zay Jeffries (1888-1965)—was advancing the field through his own work in the U.S. Embarking on research in the cutting-edge technology of microstructural analysis, Jeffries’ findings led to the development of grain size measurement techniques that became the foundation for modern characterization methods. He was an early proponent of the use of x-ray diffraction to study crystal structure. And he was one of the first to understand the relationship between processing, microstructure, and properties, which still holds as the basis for materials science. While spending much of his career at General Electric and Aluminum Casting Company (now part of Alcoa), he contributed to the success of many early aluminum alloys. “The Dean of American Metallurgists” is honored annually by the ASM Cleveland Chapter’s Zay Jeffries Night. I was delighted to attend this year’s event, which is featured in our Chapters in the News section. That meeting made Jeffries’ contributions come to life for me. For your own meander through time, discover artifacts in these pages that reveal how four remarkable pioneers made modern characterization possible. joanne.miller@asminternational.org
RkJQdWJsaXNoZXIy MTYyMzk3NQ==