istfaevent.org 3D-Micromac AG Allied High Tech Products, Inc. Angstrom Scientific, Inc. Barnett Technical Services Bruker Corporation BSET EQ Cameca Instruments Inc. Carl Zeiss Microscopy, LLC Checkpoint Technologies Comet Yxlon Contech Solutions Inc. Convalent Metrology DC – Digit Concept Denton Vacuum Eurofins | MASER Evident Excillum Gatan/EDAX Hamamatsu Corporation Herzan LLC TECHNICAL PROGRAM TOPICS • AI Applications for Failure Analysis • Boards and Systems • Case Studies: Device Analysis • Case Studies: FA Process and Workflows • Die Level Fault Isolation • EOS/ESD • Emerging FA Techniques and Concepts • FIB Circuit Edit • FIB Sample Preparation • Hardware Security and Counterfeiting • Microscopy Analysis and Materials Characterization • More than Moore: Si Photonics, Magnetics, Magneto Optics, Bitter Methods • Nanoprobing, Electrical Characterization • Package Level Fault Isolation • Packaging and Assembly • Power Devices (Si, SiC, GaN) • Product Yield, Test, and Diagnosis • Sample Preparation and Device Deprocessing • Scanning Probe Analysis • System-in-Package and 3D Devices EXHIBITION HOURS Wednesday, October 30 9:30 a.m. – 6:30 p.m. Thursday, October 31 9:30 a.m. – 4:00 p.m. Exhibitor list current as of September 4. Hexagon Hi-Rel Laboratories HILEVEL Technology Hitachi High-Tech America, Inc. Hitachi Power Solutions Co., Ltd. ibss Group Imina Technologies SA InfraTec infrared LLC Integra Technologies Integrated Service Technology Inc. Intlvac Thin Film IRLabs JEOL USA JIACO Instruments Kleindiek Inc. Materials Analysis Technology Inc. Mesoscope Technology Co. Ltd. Microsanj LLC Microscope World Microtech Laboratories Molecular Vista, Inc. Nanoscience Instruments NenoVision Neocera Magma LLC Nextron Corporation Nippon Scientific Co., Ltd. Nisene Technology Group, Inc. Nordson Test & Inspection Oxford Instruments PACE Technologies Park Systems Inc. Photothermal Spectroscopy Corp Physical Electronics PVA TePla OKOS Quantum Design Quantum Focus Instruments Corporation Quartz Imaging QZabre Ltd. Raith America, Inc. RKD Engineering RKD Systems Robson Technologies, Inc. (RTI) Seiwa Optical of America SELA USA Inc. SEMICAPS Siemens Sigray, Inc. Synopsys, Inc. Ted Pella, Inc. TeraView LTD TESCAN Thermo Fisher Scientific Tiptek, LLC Trion Technology ULTRA TEC Varioscale Inc. Waygate Technologies Wiley Science Solutions Zurich Instruments USA, Inc. EXHIBITOR LIST OCTOBER 28–NOVEMBER 1, 2024 SAN DIEGO, CA 2024 First Place Winner in False Color images, 2023 EDFAS Photo Contest. Courtesy of Heiko Stegmann, Carl Zeiss Microscopy GmbH. SPECIAL SESSIONS & EVENTS TUESDAY, OCTOBER 29 8:00 – 9:45 a.m. Opening Session and EDFAS General Membership Meeting TUESDAY, OCTOBER 29 6:30 – 9:30 p.m. 50th Anniversary Beachside Luau Bash: Social Networking Event WEDNESDAY, OCTOBER 30 4:30 – 6:00 p.m. 50 Years of Innovation Exhibitor Reception THURSDAY, OCTOBER 31 12:00 – 1:00 p.m. Women in Electronics Failure Analysis (WEFA) THURSDAY, OCTOBER 31 1:00 – 2:30 p.m. Panel Discussion: “Artificial Intelligence in Electronic Failure Analysis” THURSDAY, OCTOBER 31 2:30 – 3:30 p.m. ISTFA Turns 50: Sweetening the Celebration Expo Dessert Reception, Poster Session, and Video Contest TOOLS OF THE TRADE TOUR TUESDAY, OCTOBER 29 ISTFA attendees will have the chance to see the latest equipment and tools in action and obtain useful information in a guided tour. Participating companies include: Allied High Tech Products, JIACO Instruments, NanoScience Instruments, Quartz Imaging, SELA USA Inc., Siemens, Synopsis Inc., Thermo Fisher Scientific, ULTRA TEC, and Zeiss. Pre-registration is required. Limit of 125 attendees. SPECIAL CONTESTS See the winners of the EDFAS Video Contest, featuring three-minute videos on failure analysis, as well as the best of the EDFAS Photo Contest, with categories in optical microscopy, SEM/TEM/x-ray/UV micrographs, and photon emissions.
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