The International Symposium for Testing and Failure Analysis (ISTFA) is the premier event for the microelectronics failure analysis community. Join us in celebrating a remarkable milestone: the 50th anniversary of ISTFA! As we commemorate this golden occasion, we cordially invite you to be part of the pinnacle event for the microelectronics failure analysis community this November in San Diego. This year’s theme is Artificial Intelligence (AI). AI has been integrated into design, manufacture, process optimization, quality, reliability, and failure analysis (FA). Embracing and effectively using AI in fault isolation (FI) and FA is crucial for new technology development and high-volume mass production in the semiconductor industry. Although numerous AI applications in FI and FA have been demonstrated, there are still many unaddressed challenges, unestablished standards, and unexplored areas to be resolved. OCTOBER 28–NOVEMBER 1, 2024 | SAN DIEGO, CA registration open Riding the wave of artificial intelligence 2024 Education Workshop: Failure Analysis of Electronic Devices Sunday, October 27 | 8:30 a.m. – 12:30 p.m. Instructor: Martine Simard-Normandin, MuAnalysis Inc. Meet the 2024 Keynote Speaker: Dr. James Chambers Vice President of Silicon Engineering and Sourcing, Nvidia Corp. Wednesday, October 30 | 8:30 - 9:30 a.m. ORGANIZED BY: istfaevent.org FA Technology Roadmap Keynote: Marla Dowell, Director of CHIPS Metrology Program and NIST Boulder Laboratory Tuesday, October 29 | 10:00 - 10:45 a.m. Education Workshop: Beam Based Defect Localization Sunday, October 27 | 1:30 – 5:30 p.m. Instructor: Ed Cole, Sandia National Labs Education Workshop: Materials Science in Physical Failure Analyses for Root-cause Finding Sunday, October 27 | 8:30 a.m. – 12:30 p.m. Instructor: Wentao Qin, Microchip Technology Inc.
RkJQdWJsaXNoZXIy MTYyMzk3NQ==