ADVANCED MATERIALS & PROCESSES | APRIL 2024 15 processes are qualified and components are certified is required, i.e., a move away from fixing and controlling key process parameters. Instead, the shift is toward qualifying a process control methodology that operates within a defined qualified processing envelope. This would require: • Maturation and development of feed-forward controls (FFC) and iterative learning controls (ILC). • Development and integration of in situ sensors and control systems. • Greater use of machine learning and ICME. • Development and use of virtual twin modeling and simulation tools for the entire AM part production line. Leadership. Workshop participants sent a clear message: Government leadership is required. The government (as a neutral or facilitating party) has a unique responsibility to catalyze, develop, and promote cooperation among stakeholders (e.g., SMEs, LSIs, and standards organizations) to address the difficult challenges facing the AM community. Specific areas include: • Agreement on an “80% Solution” as to what constitutes a qualified AM vendor by LSIs and the government. • Standardized Technical Data Package (TDP) content to convey AM part and process specifications. • Data curation and open data accessibility for reference and research. • Development of standards required to reduce entry barriers and support technology adoption. These three factors—cost of compliance, technology needs, and leadership—set the stage for investigating SME-LSI barriers and the empowering roles of AM data and data management. A more detailed discussion follows. JOURNEY WORKSHOP STRUCTURE The two-and-a-half-day event aimed to generate discussion from various perspectives and stakeholders. Two keynote presentations set the tone for each day’s discussions. Four panel discussions highlighted the perspectives of LSIs, SMEs, nonprofits, and AM software tool providers, respectively. On the first two days, participants— divided into six working groups—were asked to identify and rank challenges and approaches to enabling SMEs with data (Fig. 1). The six working groups held discussions about AM process develop- ment, AM part production, and delta qualification. On the last day, two larger working groups were formed to examine the top ranked challenges from the perspectives of the SME and LSI. Results provided new insights into the complexities of these relationships and opportunities afforded by effective data management. KEYNOTE SYNOPSIS Two keynote speakers delivered presentations each day of the event (Fig. 2). These talks were used to set the tone for the day’s discussions and inspire attendees regarding the importance of the efforts and the potential impact. Day One Keynotes. Chris DeLuca, OUSD(R&E), and Neal Orringer, ASTRO America, kicked off the first day. DeLuca’s brief examined three DOD priority areas: securing the data infrastructure, establishing requirements for an AM digital technology data package (TDP), and executing path- finding demonstrations of digital manufacturing. He emphasized, “We must work together from concept Fig. 1 — Working group methodology for identifying and ranking challenges and approaches. DeLuca Orringer Furrer Gardner Bridges King Fig. 2 — Keynote speakers at NIST event.
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