4 ADVANCED MATERIALS & PROCESSES | JANUARY/FEBRUARY 2024 ASM International 9639 Kinsman Road, Materials Park, OH 44073 Tel: 440.338.5151 • Fax: 440.338.4634 Joanne Miller, Editor joanne.miller@asminternational.org Victoria Burt, Managing Editor vicki.burt@asminternational.org Frances Richards and Corinne Richards Contributing Editors Anne Vidmar, Layout and Design Allison Freeman, Production Manager allie.freeman@asminternational.org Press Release Editor magazines@asminternational.org EDITORIAL COMMITTEE John Shingledecker, Chair, EPRI Beth Armstrong, Vice Chair, Oak Ridge National Lab Adam Farrow, Past Chair, Los Alamos National Lab Rajan Bhambroo, Tenneco Inc. Daniel Grice, Materials Evaluation & Engineering Surojit Gupta, University of North Dakota Michael Hoerner, KnightHawk Engineering Hideyuki Kanematsu, Suzuka National College of Technology Ibrahim Karaman, Texas A&M University Ricardo Komai, Tesla Bhargavi Mummareddy, Dimensional Energy Scott Olig, U.S. Naval Research Lab Christian Paglia, SUPSI Institute of Materials and Construction Amit Pandey, Lockheed Martin Space Satyam Sahay, John Deere Technology Center India Kumar Sridharan, University of Wisconsin Jean-Paul Vega, Siemens Energy Vasisht Venkatesh, Pratt & Whitney ASM BOARD OF TRUSTEES Pradeep Goyal, President and Chair Navin Manjooran, Senior Vice President Elizabeth Ho man, Vice President Mark F. Smith, Immediate Past President Lawrence Somrack, Treasurer Amber Black Ann Bolcavage Pierpaolo Carlone Hanchen Huang André McDonald Christopher J. Misorski U. Kamachi Mudali James E. Saal Dehua Yang Carrie Wilson, Interim Executive Director STUDENT BOARD MEMBERS Kingsley Amatanweze, Karthikeyan Hariharan, Denise Torres Individual readers of Advanced Materials & Processes may, without charge, make single copies of pages therefrom for personal or archival use, or may freely make such copies in such numbers as are deemed useful for educational or research purposes and are not for sale or resale. Permission is granted to cite or quote from articles herein, provided customary acknowledgment of the authors and source is made. The acceptance and publication of manuscripts in Advanced Materials & Processes does not imply that the reviewers, editors, or publisher accept, approve, or endorse the data, opinions, and conclusions of the authors. A NEW WAY OF SEEING The turn of the calendar to a new year brings with it an opportunity to look at our world in new ways. Likewise, the field of microscopy has been improved over time by various innovators and inventions that literally opened the aperture to allow for fresh ways of seeing the material world. One of the fathers of microscopy, Antonie van Leeuwenhoek of Holland (1632-1723), taught himself methods for grinding and polishing tiny lenses of great curvature that gave magnifications up to 270x. Using these lenses, he built the first practical microscope. Henry Le Chatelier (1850-1936), a French inventor, is credited with developing the modern metallurgical microscope. Exploring from a different angle, the British father-and-son team Sir William Henry Bragg (1862-1942) and Sir William Lawrence Bragg (1890-1971) first showed that diffracted x-rays could be used to map the position of atoms within a crystal and determine its three-dimensional structure. They constructed the first x-ray spectroscope, revolutionizing the study of x-ray crystallography. Meanwhile, experiments in Germany by Ernst Ruska and his adviser Max Knoll made advancements in beam technology in the 1930s. By 1933, the pair had built an electron microscope that could surpass the magnifying limits of the optical microscope at that time. Subsequently, the first practical electron microscope was constructed at the University of Toronto by Eli Franklin Burton (1879-1948) and his students in 1938. The instrument was six feet tall with a magnifying power of 20,000x and a resolution of 140 angstroms. Further advancements led to the development of the transmission electron microscope (TEM) and later the scanning electron microscope (SEM). By 1950, commercial TEMs were available with a resolution of ~1 nm. In 1990, the German trio of Maximilian Haider, Harald Rose, and Knut Urban embarked on a project to correct aberrations of optical lenses that had been plaguing the industry for nearly 60 years. In 2001, their work gave rise to the first application-oriented commercial prototype of a new generation of electron microscopes. Advancing to the present, improvements continue to be made every day as to how we view and analyze materials. Recently, researchers at UCLA developed a type of atomic electron tomography that allows for the 3D atomic order of medium and high-entropy alloys (HEAs) to be directly observed for the first time. And now, as described in our lead article, mixed reality enters the picture as a new lab partner for TEM. Working together, the two provide a hightech and efficient method for conducting materials characterization. Users can run computer simulations and interact with holograms as they study and analyze a particular material. Broader than virtual reality, mixed reality allows the user to see more than just what a set of goggles puts in front of them. Their visual field also includes the ability to interact with “real-world” equipment. It’s a comprehensive view of two worlds at once. New times lead to new methods and discoveries. In the field of microscopy, the latest version of reality comes with a much wider view. joanne.miller@asminternational.org Atomic map of an HEA nanoparticle. Courtesy of UCLA.
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