istfaevent.org SPECIAL SESSIONS Monday, November 13 – 7:30 – 10:00 a.m. Opening Session and EDFAS General Membership Meeting Wednesday, November 15 – 12:00 – 1:30 p.m. Women in Electronics Failure Analysis (WEFA) Wednesday, November 15 – 1:30 – 3:00 p.m. Panel Discussion: “Moving Toward Reliable Power Electronics Devices” TOOLS OF THE TRADE TOUR Monday, November 13 ISTFA attendees will have the chance to see the latest equipment and tools in action and obtain useful information in a guided tour. Participating companies include: ASAP-1 with Ultra Tec, JIACO Instruments, NanoScience Instruments, Quartz Imaging, SELA USA Inc., Siemens, Synopsis Inc., Thermo Fisher Scientific, and Zeiss. Pre-registration is required. Limit of 125 attendees. Tools Tour will practice any/all safety protocols set forth by the Phoenix Convention Center. SPECIAL CONTESTS See the winners of the EDFAS Video Contest, featuring three-minute videos on failure analysis, as well as the best of the EDFAS Photo Contest, with categories in optical microscopy, SEM/TEM/x-ray/UV micrographs, and photon emissions. First Place Winner in False Color images, 2022 EDFAS Photo Contest. Courtesy of Wentao Qin, Onsemi. 3D-MIcromac AG Allied High Tech Products, Inc. Angstrom Scientific, Inc. attocube system Inc. Barnett Technical Services Bruker Corporation BSET EQ CAMECA Carl Zeiss Microscopy, LLC Checkpoint Technologies Comet Yxlong Contech Solutions Inc. DC – Digit Concept Denton Vacuum Eurofins | MASER Gatan EDAX Hamamatsu Corporation Herzan LLC Hexagon/Volume Graphics Hi-Rel Laboratories Hitachi High-Tech America, Inc. Hitachi High Power Solutions Co., Ltd. ibss Group Imina Technologies SA InfraTec infrared LLC Integra Technologies Intlvac Thin Film IR Labs JEOL USA JIACO Instruments KEYENCE Corporation of America Keysight Technologies Kleindiek Inc. Materials Analysis Technology Mesoscope Technology Co. Ltd. Microtech Laboratories Nanoscience Instruments Neocera Magma LLC Nippon Scientific Co., Ltd. Nisene Technology Group, Inc. Nordson Test & Inspection Oxford Instruments PACE Technologies Park Systems Inc. Photothermal Spectroscopy Corp Physical Electronics PVA TePla OKOS Quartz Imaging Raith America, Inc. RKD Engineering Corp, Inc. RKD Systems Robson Technologies Inc. Sage Analytical Lab Seiwa Optical of America SELA USA Inc. SEMICAPS Sensofar Siemens EDA Sigray, Inc. SmarAct Inc. Spirit Electronics Synopsys, Inc. Ted Pella, Inc. TeraView LTD TESCAN Thermo Fisher Scientific Tiptek, LLC Trion Technology ULTRA TEC Varioscale Inc. Waygate Technologies XEI Scientific Zurich Instruments USA, Inc. Exhibitor list current as of September 21. EXHIBITOR LIST TECHNICAL PROGRAM TOPICS Emerging FA Techniques and Concepts System-in-Package and 3D Devices AI Applications for Failure Analysis Die Level Fault Isolation Package Level Fault Isolation Packaging and Assembly Nanoprobing and Electrical Characterization Scanning Probe Analysis Sample Preparation and Device Deprocessing FIB Sample Preparation FIB Circuit Analysis and Edit Microscopy Analysis and Materials Characterization Packaging and Assembly Boards and Systems Case Studies: FA Process and Workflows Hardware Attacks, Security, and Reverse Engineering Detecting and Preventing Counterfeit Microelectronics Power Devices (Si, SiC, GaN) Product Yield, Test, and Diagnosis EXHIBITION HOURS Tuesday, November 14 9:30 a.m. – 6:00 p.m. Wednesday, November 15 9:00 a.m. – 4:00 p.m. NOVEMBER 12–16, 2023 | PHOENIX, ARIZONA 2023
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