Chasing Ever-smaller and More Elusive Defects 2022 PASADENA, CALIFORNIA PASADENA CONVENTION CENTER OCTOBER 30 – NOVEMBER 3, 2022 The 48th International Symposium for Testing and Failure Analysis (ISTFA), the premier conference and exhibition for themicroelectronics failure analysis community, is scheduled for October 30 – November 3 in Pasadena. This year’s theme—Chasing Ever-smaller andMore Elusive Defects—will be evident throughout the event in user groupmeetings, technical presentations, and the keynote address. The conference also includes the highly popular EDFAS video and photo contests. ISTFA once again o ers the opportunity to take an immersive half or full-day educational course. This year’s tutorial programextends the learning process to awider selection of topics. The technical sessions feature over 100 presentations of original unpublishedwork in areas such as sample preparation and device deprocessing, fault isolation, AI applications for FA, scanning probe analysis, and emerging FA techniques and concepts. And the Expo features key companies showcasing the best technologies and products in the industry. ISTFA’s keynote speaker, Dr. Emmanuel Crabbé, is an IBM Fellow responsible for defining the technology roadmap for the processors at the core of IBM’s POWER and Z Systems. He was the first to demonstrate bipolar transistor operation above 100 GHz in a silicon-based technology. His talk will answer the question of where to go next with CMOS scaling. EDUCATION WORKSHOPS • ESD – FA Instructor: Dr. Steven H. Voldman • Beam-Based Defect Localization Instructor: Dr. Ed Cole, Jr., FASM • FA of Electronic Devices Instructor: Martine Simard-Normandin For dates, times, and full course descriptions, visit istfaevent.org. TUTORIALS An expanded tutorial program addresses 21 topics, including three new ones: Analytical Techniques for Contamination Troubleshooting • Victor Chia Failure and Thermal Dissipation Analysis with Infrared Thermography • Stephan R. Larmann Leveraging the Power of Arduino to Elevate the Failure Analysis Lab • Tim Watson 48TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS sponsored by: ORGANIZED BY: ISTFAEVENT.ORG
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