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A D V A N C E D M A T E R I A L S & P R O C E S S E S | A P R I L 2 0 2 0 2 9 (a) (b) Fig. 6a — Creating a surface topography 3D representation through the acquisition of a stereo pair of images. Rendering generated using MountainMaps (Digital Surf) software. capabilities of 3D analysis, nanomateri- als imaging at extremely low accelerat- ing voltages, and seamless correlation between optical and SEM images— combined with ease of use—make SEMs indispensable tools in the labora- tory toolkit. ~AM&P For more information: Natasha Erd- man, Jennifer Misuraca, and Donna Guarrera, JEOL USA, 11 Dearborn Rd., Peabody, MA 01930, 978.535.5900, salesinfo@jeol.com, www.jeolusa.com . References 1. N. Erdman, R. Campbell, and A. Asahina, “Precise SEM Cross Section Polishing via Argon Beam Milling,” Microscopy Today, 14(3), p 22-25, 2006, doi:10.1017/S155192950005762X. 2. D.C. Bell and N. Erdman (eds.), Low Voltage Electron Microscopy–Principles and Applications, RMS Wiley, 2012. Fig. 6b— Live 3D surface representation during SEM observation using a multi-segmented backscatter detector.