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F A I L U R E S W O R T H A N A L Y Z I N G The 44th International Symposium for Testing and Failure Analysis (ISTFA), the premier conference and exhibition for themicroelectronics failure analysis community, will be heldOctober 28 – November 1 in Phoenix. This year’s theme—Failures Worth Analyzing—will be evident throughout the five-day event in user groupmeetings, technical presentations, and on the exhibitor floor amidst the largest display of failure analysis equipment in the industry with live demonstrations of the latest tools and technology. Throughout the conference, attendees will have ample opportunity to engage in networking events, receptions, and social activities each day, including the popular EDFAS video and photo contests. ISTFA once again opens on a Saturday, offering early arrivers the opportunity to take an immersive half or full-day educational course. This year’s all-day tutorial program on Sunday extends the learning process to a wider selection of topics. Technical sessions beginMonday, featuring over 125 presentations of original unpublishedwork in areas such as organic electronics, sample preparation and device deprocessing, fault isolation, scanning probe analysis, and emerging FA techniques and concepts. In keeping with the theme of failures worth analyzing, ISTFA’s keynote sessionwill focus on autonomous vehicle (AV) technology with presentations by two industry experts. For the first time, ISTFAwill co-locate with the International Test Conference (ITC), an IEEE conference dedicated to logic andmemory testing of electronic devices, diagnosis, and yield analysis. Joint sessions with ISTFA and ITC highlighting topics such as diagnosis and yieldwill be offered. Attendees will also benefit froma joint expo floor that represents the largest ever at ISTFAwith 30%more companies, technologies, and products to visit and explore. OCTOBER 28 NOVEMBER 1 2018 PHOENIX CONVENTION CENTER 44TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAI LURE ANALYSIS Organized by: EDUCATION COURSES • Fault Isolation Techniques for Failure Analysis • EOS/ESD Failure Mechanisms and Design Solutions • Failure Analysis of Electronic Devices • Shining a Light on LED Technology: Construction, Reliability, Qualification, Failure Modes • Beam-Based Defect Localization For full course descriptions visit asminternational.org/web/istfa-2018. SATURDAY, OCTOBER 27 TUTORIALS An expanded tutorial program addresses 23 topics, including three new ones: • EOS/ESD Failure Mechanisms and Design Solutions • Early Life Failures in Automotive Electronics and Their Root Causes • Reliability of FIFA Challenges of Medical Device Electronics SUNDAY, OCTOBER 28 SPECIAL CONTESTS See the winners of the EDFAS Video Contest, as well as the best of the EDFAS Photo Contest by attending the event.