edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 3 52 sample are analyzed. If the Aivia AI-based image analysis software detects indications of a rare event, the positions are sent back to the controlling software of Stellaris, which is called Navigator Expert. The positions of the identified events are automatically scanned at high resolution and in three dimensions based on the user’s defined settings. With Autonomous Microscopy powered by Aivia, operator interaction is limited to the initial setup. Objects are detected much faster and more accurately. The same settings can be applied for other experiments to ensure consistency. Because only objects of interest are identified and captured, data acquisition and final analysis time is significantly reduced. This exclusivity also means an extreme savings of storage space. For more information, visit leica-microsystems.com. SKYSCAN 2214 CMOS EDITION NANOSCALE 3D X-RAY MICROSCOPE At the 12th International Conference on Industrial Computed Tomography (ICT) Bruker unveiled the new SKYSCAN 2214 CMOS edition, a multiscale x-ray microscope based on nano-CT (computed tomography) for industrial and academic research. With the CMOS edition, the highly successful and proven SKYSCAN 2214 platform now incorporates the latest scientific CMOS (sCMOS) detector technology and brings cutting-edge x-ray imaging at highest resolution to the next level. SKYSCAN 2214 CMOS edition retains the innovative, modular design that accommodates up to four detectors, allowing users to select at the touch of a button the most appropriate detector for their samples and applications. This unique design now encompasses a 6 Mp flat panel and three optimized 15/16 Mp sCMOS detectors. They provide an unrivalled field of view for the respective true 3D resolution down to the 500 nm range. In addition, the new sCMOS detectors excel at imaging high- and low-density features in the same object thanks to their large dynamic range and ultra-low noise. The user-friendly, comprehensive 3D.SUITE software for straightforward data collection, advanced image analysis, and powerful visualization complements the SKYSCAN 2214 CMOS edition. This powerful software suite includes advanced capabilities such as spiral scanning with exact reconstruction for artifact-free imaging of planar features and variable rotation step tomography for more efficiently scanning of high aspect ratio objects. Furthermore, phase retrieval algorithms for propagation-based phase contrast x-ray imaging can reveal features that would otherwise remain hidden when using only absorption contrast imaging. Dr. Geert Vanhoyland, the Bruker AXS product line manager for 3D x-ray microscopy, commented, “The proven ultra-high-resolution nano-CT capability of SKYSCAN 2214 CMOS edition is a key enabler to stateof-the-art materials science such as the development of lightweight high-strength composite materials. The substantially larger field of view of the sCMOS detectors provides a statistically relevant view at highest resolution in porous materials such as foam structures. Other contemporary research fields, such as fuel cells and other energy storage devices, particularly benefit from the further improved image quality achieved with the new sCMOS detectors.” For more information, visit bruker.com. A mitosis (cell division) detected with Autonomous Microscopy powered by Aivia. Bruker SKYSCAN 2214 CMOS nanoscale 3D x-ray microscope.
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