edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 3 46 DIRECTORY OF INDEPENDENT FA PROVIDERS Rosalinda M. Ring, Thermo Fisher Scientific jmj4papa@yahoo.com Electronic companies of all types and sizes require failure analysis (FA) services. Our goal is to supply a resource of FA service providers for your reference files. The directory lists independent providers and their contact information, expertise, and types of technical services offered. APPLUS+ LABORATORIES Campus UAB – Ronda de la Font del Carme, s/n 08193 Bellaterra Barcelona, Spain +34.935.67.20.00 www.appluslaboratories.com/global/en/contact-us/ offices Services Offered: Structural testing, materials testing, fire testing, EMC, wireless and electrical safety testing, environmental testing, cybersecurity evaluations, research and development, certification, and calibration. EXEL LABORATORY SERVICES 158 W. Clinton St., Unit BB Mail Stop #7, Dover, NJ 07801 973.620.9993 edgar.leone@exel-labs.com www.exel-labs.com/index.htm Services Offered: Specializing in industrial problem solving, failure analysis, laboratory, and research and development, advanced capabilities in SEM, surface analysis, and materials characterization. Tools and Techniques: Scanning electron microscopy (SEM), energy dispersive x-ray analysis (EDX), energy dispersive spectroscopy (EDS), wavelength dispersive x-ray analysis (WDX), secondary electron imaging (SEI), backscattered electron imaging (BEI), automated WDX analysis, atomic force microscopy (AFM), scanning probe microscopy (SPM), roughness measurements, optical microscopy, stereomicroscopy, x-ray mapping, x-ray linescan analysis, quantitative image analysis (QIA), accelerated life testing, x-ray photoelectron spectroscopy (XPS), electron spectroscopy for chemical analysis (ESCA), Fourier transform infrared analysis (FTIR), attenuated total reflectance (ATR), differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), inductively coupled plasma analysis (ICP), and outsource options (TEM, Raman, ToF- SIMS, GC/MS). FAI MATERIALS TESTING LABORATORY INC. 1590 N. Roberts Rd. NW, Suite 206 Kennesaw, GA 30144 770.928.1930 info@fai.us www.fai.us/contact-us Services Offered: Physical testing, materials testing, chemical analysis, thermal analysis, plastic and polymer testing, microscopy and imaging services, failure analysis, cleanliness testing, expert witness, and consulting services. Tools and Techniques: Optical microscopy, metallographic optical microscopy equipped with an ultra-bright xenon lamp, field emission SEM, EDS for elemental analysis and mapping, infrared microscopy (FT-IR), tensile strength elongation, compressive strength, coefficient of friction, modulus of rupture, flexural modulus, shore hardness, Izod impact energy, and drop impact force. INFINITA LAB INC. 39899 Balentine Dr., Suite 200 Newark, CA 94560 888.878.3090 hello@infinitalab.com infinitalab.com/contact-us/ Services Offered: Metrology testing, materials testing, and product testing. Tools and Techniques: Atomic-scale microscopy, elemental analysis by secondary ion mass spectrometry (SIMS), composition by spectroscopy such as FTIR, Raman, XRF, OES, chemical analysis for contamination, chemistry, and synthesis, trace element analysis using GD-MS, ICP-MS, ICP-OES, and LIBS, surface analysis and packaging defects by profilometry, SAM, 3D x-ray, materials characterization using XRD, EXAFS, XPS, XRR, AFM, atom probe tomography (APT), auger electron spectroscopy (AES), colorimetry, cryogenic transmission electron microscopy (Cryo-TEM), destructive physical analysis (DPA), DSC, dual beam FIB, electron beam induced current (EBIC), EBSD, EDS, electron energy loss spectroscopy (EELS), evolved gas analysis (EGA), electrochemical analysis, ETV-ICP-OES, FTIR, gas chromatography-mass spectrometry (GC-MS), gas chromatography-tandem mass spectrometry (GC-MS/MS), realtime x-ray (RTX), SAM, SEM, SEM–cathodoluminescence, SIMS, time-of-flight secondary ion mass spectrometry (TOF-SIMS), and total reflection x-ray fluorescence (TXRF).
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