edfas.org 43 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 3 The EDFAS Education Subcommittee strives for the development and delivery of educational products to the EDFAS membership. Keeping with its strategic focus on reaching a broader audience, including facilitating Q&A and educational exchanges on the ASM Connect platform, the Subcommittee has been inviting ISTFA tutorial speakers and others to present short format presentations on selected FA topics. These presentations are now available on ASM Connect. Use the following link: https:// bit.ly/3mCn7m6 and click on the Educational Tutorials folder. An ASM Connect login is required. For this issue, we are highlighting a tutorial on nearfield terahertz imaging by Daniel Johnson, Navid Asadi, and Chengjie (Peter) Xi. The terahertz (THz) frequency range occupies a position in the electromagnetic spectrum between the microwave band (below 100 GHz) and the far infrared band (above 10 THz). Within this range, there exists a notable disparity known as the “terahertz gap,” which arises due to the difficulties associated with generating and detecting frequencies in this range. Progressing from the electronics region (microwave band) toward the terahertz range is impeded by the limited carrier mobility of oscillating semiconductors. Conversely, approaching the terahertz range from the photonics region (infrared band) necessitates reducing the energy of photons emitted through electron transitions to align EDUCATION NEWS Navid Asadi, University of Florida nasadi@ece.ufl.edu Bhanu P. Sood, NASA Goddard Space Flight Center EDFAS Education Subcommittee Chair bhanu.sood@nasa.gov SPOTLIGHT ON TUTORIALS with the THz frequency. However, achieving this reduction is hindered by the higher thermal energy present at room temperature compared to THz photons. While terahertz systems have historically received limited attention in commercial contexts, the advent of terahertz time-domain spectroscopy (THz-TDS) in 1995 sparked significant interest and rapid technological advancements. As a result, there has been substantial progress in both the emission and detection of THz frequency radiation. Consequently, the potential applications of THz-TDS have expanded considerably, encompassing fields such as biomedicine, security controls, industrial inspection, non-destructive analysis, spectroscopic mapping, and numerous other areas. Additionally, THz technology offers the potential to characterize IC packaging for the purpose of hardware assurance. The physical inspection methods of THz-TDS possess several advantages for IC packaging characterization, including lower and non-ionizing energy, as well as A point spread function is used to eliminate noise and blurriness. "...THERE HAS BEEN SUBSTANTIAL PROGRESS IN BOTH THE EMISSION AND DETECTION OF THz FREQUENCY RADIATION."
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